Publication:

Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs

Date

2016

Proceedings Paper

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Files

33358.pdf 471.56 KB

Author(s)

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De Jaeger, Brice

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Bakeroot, Benoit

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Stoffels, Steve

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Van Hove, Marleen

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Groeseneken, Guido

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Decoutere, Stefaan

Metrics

1776 since deposited on 2021-10-23

2last month

Acq. date: 2025-12-17