Publication:

Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays

Date

2009

Journal article

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Files

17959.pdf 646.25 KB

Author(s)

Griffoni, Alessio

;

Silvestri, Marco

;

Gerardin, Simone

;

Meneghesso, Gaudenzio

;

Paccagnella, Alessandro

;

;

de Potter de ten Broeck, Muriel

;

;

Nackaerts, Axel

Journal

IEEE Transactions on Nuclear Science

Statistics

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Acq. date: 2026-01-26