Deep level assessment of n-type Si/SiO2 metal-oxide-semiconductor capacitors with embedded Ge quantum dots

Publication:

2017

Proceedings Paper

Author(s)

Aouassa, Mansour

;

Vrielinck, Henk

;

Simoen, Eddy

1929 since deposited on 2021-10-24

Acq. date: 2026-06-20