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Extended Methodology to Determine SRAM Write Margin in Resistance-Dominated Technology Node
Publication:
Extended Methodology to Determine SRAM Write Margin in Resistance-Dominated Technology Node
Date
2022
Journal article
https://doi.org/10.1109/TED.2022.3165738
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Liu, Hsiao-Hsuan
;
Salahuddin, Shairfe Muhammad
;
Abdi, Dawit
;
Chen, Rongmei
;
Weckx, Pieter
;
Matagne, Philippe
;
Catthoor, Francky
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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4
since deposited on 2022-05-04
Acq. date: 2025-10-25
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1320
since deposited on 2022-05-04
Acq. date: 2025-10-25
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Metrics
Downloads
4
since deposited on 2022-05-04
Acq. date: 2025-10-25
Views
1320
since deposited on 2022-05-04
Acq. date: 2025-10-25
Citations