Publication:
Random Telegraph Noise and Radiation Response of 80 nm Vertical Charge-Trapping NAND Flash Memory Devices With SiON Tunneling Oxide
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111 since deposited on 2024-09-21
Acq. date: 2025-10-23
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415 since deposited on 2024-09-21
Acq. date: 2025-10-23
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111 since deposited on 2024-09-21
Acq. date: 2025-10-23
Views
415 since deposited on 2024-09-21
Acq. date: 2025-10-23
Citations