Publication:
On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Statistics
Views
1939 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-03-01
Citations
Statistics
Views
1939 since deposited on 2021-10-20
2last month
1last week
Acq. date: 2026-03-01
Citations