Publication:
Excess Lorentzian noise in partially-depleted SOI-nMOSFETs induced by an accumulation back gate-bias
Date
| dc.contributor.author | Lukyanchikova, N. | |
| dc.contributor.author | Garbar, N. | |
| dc.contributor.author | Smolanka, A. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-15T14:34:47Z | |
| dc.date.available | 2021-10-15T14:34:47Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9229 | |
| dc.source.beginpage | 433 | |
| dc.source.endpage | 435 | |
| dc.source.issue | 6 | |
| dc.source.journal | IEEE Electron Device Letters | |
| dc.source.volume | 25 | |
| dc.title | Excess Lorentzian noise in partially-depleted SOI-nMOSFETs induced by an accumulation back gate-bias | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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