Publication:
BTI reliability and time-dependent variability of stacked gate-all-around Si nanowire transistors
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1994 since deposited on 2021-10-24
3last month
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Acq. date: 2026-04-08
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Statistics
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1994 since deposited on 2021-10-24
3last month
2last week
Acq. date: 2026-04-08
Citations