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Leakage control in 0.4-nm EOT Ru/SrTiOx/Ru metal-insulator-metal capacitors: process implications
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Leakage control in 0.4-nm EOT Ru/SrTiOx/Ru metal-insulator-metal capacitors: process implications
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Swerts, Johan
;
Popovici, Mihaela Ioana
;
Kaczer, Ben
;
Aoulaiche, Marc
;
Redolfi, Augusto
;
Clima, Sergiu
;
Caillat, Cristian
;
Wang, W.C.
;
Afanasiev, Valeri
;
Jourdan, Nicolas
;
Hody, Hubert
;
Olk, Christina
;
Van Elshocht, Sven
;
Jurczak, Gosia
Journal
IEEE Electron Device Letters
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Views
1922
since deposited on 2021-10-22
2
last month
1
last week
Acq. date: 2025-12-10
Citations