Publication:
Gate-length dependent radiation damage in 2-MeV electron-irradiated Si1-xGexS/D p-MOSFETs
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2029 since deposited on 2021-10-20
Acq. date: 2025-12-12
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2029 since deposited on 2021-10-20
Acq. date: 2025-12-12
Citations