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A comparative study of gate direct tunneling and drain leakage currents in N-MOSFET's with sub-2-nm gate oxides
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1900 since deposited on 2021-10-14
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Acq. date: 2025-12-12
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1900 since deposited on 2021-10-14
2last month
2last week
Acq. date: 2025-12-12
Citations