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Fabrication and use of metal tip and tip-on-tip probes for AFM-based device analysis
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Fabrication and use of metal tip and tip-on-tip probes for AFM-based device analysis
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Date
1998
Proceedings Paper
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2826.pdf
1.47 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hantschel, Thomas
;
De Wolf, Peter
;
Trenkler, Thomas
;
Stephenson, Robert
;
Vandervorst, Wilfried
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Abstract
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1980
since deposited on 2021-09-30
2
last month
Acq. date: 2025-12-10
Citations
Metrics
Views
1980
since deposited on 2021-09-30
2
last month
Acq. date: 2025-12-10
Citations