Publication:

RF characterization and modeling of through-silicon vias

Date

2013

Proceedings Paper

Simple item page Full metadata Statistics

Files

26660.pdf 630.65 KB

Author(s)

;

Ryckaert, Julien

;

Van der Plas, Geert

;

Statistics

1850 since deposited on 2021-10-21

3last month

Acq. date: 2026-08-27