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Improved extraction of Si substrate parameters from combined I-V and C-V measurements on P-N junction diodes
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Improved extraction of Si substrate parameters from combined I-V and C-V measurements on P-N junction diodes
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Date
1997
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Czerwinski, A.
;
Simoen, Eddy
;
Vanhellemont, Jan
;
Tomaszewski, D.
;
Gibki, J.
;
Bakowski, A.
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1931
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Acq. date: 2025-12-12
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Views
1931
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-12
Citations