Publication:

Study of deposition behavior of thermal/plasma-enhanced chemical vapor deposition (CVD/PECVD) of manganese on porous SiCOH low-k dielectric materials for copper diffusion barrier application in advanced interconnect technology

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1961 since deposited on 2021-10-20
Acq. date: 2025-10-24

Citations

Metrics

Views

1961 since deposited on 2021-10-20
Acq. date: 2025-10-24

Citations