Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Study of deposition behavior of thermal/plasma-enhanced chemical vapor deposition (CVD/PECVD) of manganese on porous SiCOH low-k dielectric materials for copper diffusion barrier application in advanced interconnect technology
Publication:
Study of deposition behavior of thermal/plasma-enhanced chemical vapor deposition (CVD/PECVD) of manganese on porous SiCOH low-k dielectric materials for copper diffusion barrier application in advanced interconnect technology
Date
2012
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Jourdan, Nicolas
;
Baklanov, Mikhaïl
;
Meersschaut, Johan
;
Vereecke, Guy
;
Conard, Thierry
;
Wilson, Chris
;
Ablett, James
;
Fonda, Emiliano
;
Geypen, Jef
;
Siew, Yong Kong
;
Van Elshocht, Sven
;
Tokei, Zsolt
Journal
Abstract
Description
Metrics
Views
1961
since deposited on 2021-10-20
Acq. date: 2025-10-24
Citations
Metrics
Views
1961
since deposited on 2021-10-20
Acq. date: 2025-10-24
Citations