Browsing imec Publications by author "Caillat, Christian"
Now showing items 1-20 of 24
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A low-power HKMG CMOS platform compatible with DRAM node 2x and beyond
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Aoulaiche, Marc; Cho, Moon Ju; Noh, Kyung Bong; Son, Yunik; Na, Hoon Jo; Kauerauf, Thomas; Douhard, Bastien; Nazir, Aftab; Chew, Soon Aik; Milenin, Alexey; Altamirano Sanchez, Efrain; Schoofs, Geert; Albert, Johan; Sebaai, Farid; Vecchio, Emma; Paraschiv, Vasile; Vandervorst, Wilfried; Lee, Sun Ghil; Collaert, Nadine; Fazan, Pierre; Horiguchi, Naoto; Thean, Aaron (2014) -
A new high-k/metal gate CMOS integration scheme (Diffusion and Gate Replacement) suppressing gate height asymmetry and compatible with high-thermal budget memory technologies
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Cho, Moon Ju; Simoen, Eddy; Aoulaiche, Marc; Albert, Johan; Chew, Soon Aik; Noh, Kyung Bong; Son, Yunik; Fazan, Pierre; Horiguchi, Naoto; Thean, Aaron (2014) -
Diffusion and gate replacement: a new gate-first high-k/metal gate CMOS integration scheme suppressing gate height symmetry
Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Caillat, Christian; Cho, Moon Ju; Simoen, Eddy; Aoulaiche, Marc; Albert, Johan; Chew, Soon Aik; Noh, Kyung Bong; Son, Yunik; Mitard, Jerome; Mocuta, Anda; Horiguchi, Naoto; Fazan, Pierre; Thean, Aaron (2016) -
Effect of interface states on 1T-FBRAM cell retention
Aoulaiche, Marc; Collaert, Nadine; Blomme, Pieter; Simoen, Eddy; Altimime, Laith; Groeseneken, Guido; Jurczak, Gosia; Mendes Almeida, Luciano; Caillat, Christian; Mahatme, N.N. (2012) -
Endurance of one transistor floating body RAM on UTBOX SOI
Aoulaiche, Marc; Bravaix, Alain; Simoen, Eddy; Caillat, Christian; Cho, Moon Ju; Witters, Liesbeth; Blomme, Pieter; Fazan, Pierre; Groeseneken, Guido; Jurczak, Gosia (2014) -
Floating body retention analysis for 1T-DRAM
Aoulaiche, Marc; Simoen, Eddy; Witters, Liesbeth; Claeys, Cor; Jurczak, Gosia; Nicoletti, Talitha; dos Santos, Sara; Martino, Jao Martino; Caillat, Christian; Fazan, Pierre (2013) -
I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration
Ritzenthaler, Romain; Schram, Tom; Cho, Moon Ju; Mocuta, Anda; Horiguchi, Naoto; Thean, Aaron; Spessot, Alessio; Caillat, Christian; Aoulaiche, Marc; Fazan, Pierre; Noh, Kyung Bong; Son, Yunik (2015) -
Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors
Aoulaiche, Marc; Federico, Antonio; Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Arimura, Hiroaki; Cho, Moon Ju; Kauerauf, Thomas; Crupi, Felice; Spessot, Alessio; Caillat, Christian; Fazan, Pierre; Na, Hoon Joo; Son, Yunik; Noh, Kyung Bong; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron (2013) -
Impact of DRAM process flow on the performance of periphery devices for next generation mobile applications
Spessot, Alessio; Caillat, Christian; Srividya, Vidya; Fazan, Pierre; Schram, Tom; Mitard, Jerome (2011) -
Impact of generation centers on the retention time in 1T-FBRAM
Aoulaiche, Marc; Caillat, Christian; Simoen, Eddy; Groeseneken, Guido; Jurczak, Gosia (2012) -
Insights in low frequency noise of advanced and high-mobility channel transistors
Simoen, Eddy; Romeo, Tomasso; Luque Rodriguez, Abraham; Jimenez Tejada, Juan Antonio; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Mitard, Jerome; Caillat, Christian; Fazan, Pierre; Crupi, Felice; Claeys, Cor (2012) -
Low-power DRAM-compatible replacement gate high-k/metal gate stacks
Ritzenthaler, Romain; Schram, Tom; Bury, Erik; Mitard, Jerome; Ragnarsson, Lars-Ake; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron; Spessot, Alessio; Caillat, Christian; Srividya, Vidya; Fazan, Pierre (2012) -
Low-power DRAM-compatible replacement gate high-k/metal gate stacks
Ritzenthaler, Romain; Schram, Tom; Bury, Erik; Spessot, Alessio; Caillat, Christian; Srividya, Vidya; Sebaai, Farid; Mitard, Jerome; Ragnarsson, Lars-Ake; Groeseneken, Guido; Horiguchi, Naoto; Fazan, Pierre; Thean, Aaron (2013) -
Ni(Pt) silicide with improved thermal stability for application in DRAM PERI or RMG devices
Schram, Tom; Spessot, Alessio; Ritzenthaler, Romain; Rosseel, Erik; Caillat, Christian; Horiguchi, Naoto; Fazan, Pierre (2013) -
Ni(Pt) silicide with improved thermal stability for application in DRAM periphery and replacement metal gate devices
Schram, Tom; Spessot, Alessio; Ritzenthaler, Romain; Rosseel, Erik; Caillat, Christian; Horiguchi, Naoto (2014) -
On the correlation between the retention time of FBRAM and the low-frequency noise of UTBOX SOI nMOSFETs
Simoen, Eddy; Aoulaiche, Marc; Veloso, Anabela; Jurczak, Gosia; Claeys, Cor; Mendes Almeida, Luciano; Andrada, Gloria; Luque Rodrigues, Abraham; Jimenez Tejada, Juan Antonio; Caillat, Christian; Fazan, Pierre (2012) -
On the variability of the low-frequency noise in UTBOX SOI nMOSFETs
Simoen, Eddy; Andrade, G.M.C.; Mendes Almeida, Luciano; Aoulaiche, Marc; Caillat, Christian; Jurczak, Gosia; Claeys, Cor (2012) -
On the variability of the low-frequency noise in UTBOX SOI nMOSFETs
Simoen, Eddy; Andrade, Maria Gloria; Mendes Almeida, Luciano; Aoulaiche, Marc; Caillat, Christian; Jurczak, Gosia; Claeys, Cor (2013) -
Optimized process simulation of USJ for HKMG DRAM periphery transistors
Spessot, Alessio; Caillat, Christian; Ritzenthaler, Romain; Schram, Tom; Fazan, Pierre (2014) -
Optimizing the front and back biases for the best sense margin and retention time in UTBOX FBRAM
Mendes Almeida, Luciano; Sasaki, Katia; Caillat, Christian; Aoulaiche, Marc; Collaert, Nadine; Jurczak, Gosia; Simoen, Eddy; Claeys, Cor; Martino, Joao (2013)