Recently added

Evaluating CoAP end to end security for constrained wireless sensor networks

Fournaris, A.P.; Giannoulis, Spilios; Koulamas, C. (2019)

Molybdenum as an Alternative Metal: Thin Film Properties

Founta, Valeria; Witters, Thomas; Mertens, Sofie; Vanstreels, Kris; Meersschaut, Johan; Van Marcke, Patricia; Korytov, Maxim; Franquet, Alexis; Wilson, Chris; Tokei, Zsolt; Van Elshocht, Sven; Adelmann, Christoph (2019)

Imec's defect reduction strategies for EUV single exposed 32nm pitch line and space patterns

Foubert, Philippe; De Bisschop, Peter; Bekaert, Joost; Beral, Christophe; Rincon Delgadillo, Paulina (2019)

Log-based intrusion detection for Cloud Web applications using machine learning

Fontaine, Jaron; Kappler, C.; Shahid, Adnan; De Poorter, Eli (2019)

Towards low-complexity wireless technology classification across multiple environments

Fontaine, Jaron; Fonseca, E.; Shahid, Adnan; Kist, M.; DaSilva, L.A.; Moerman, Ingrid; De Poorter, Eli (2019-08)

Evaluation of alternative vertical transistors for 3D NAND applications

Florent, Karine (2019-06)

Opportunities and challenges in APT metrology for semiconductor applications

Fleischmann, Claudia; Cuduvally, Ramya; Morris, Richard; Melkonyan, Davit; Op de Beeck, Jonathan; Makhotkin, Igor; van der Heide, Paul; Vandervorst, Wilfried (2019)

Low-frequency Noise and Defects in Copper and Ruthenium Resistors

Fleetwood, Dan; Beyne, Sofie; jiang, Rong; Zhao, S. E.; Whang, P.; Bonaldo, S.; McCurdy, M. W.; Tokei, Zsolt; De Wolf, Ingrid; Croes, Kristof; Zhang, E. X.; Alles, M. S.; Schrimpf, Ronald; Reed, Robert; Linten, Dimitri (2019)

Characterization of losses due to absorption in rear-side N-type poly-Si passivating contacts

Firat, Meric; Recaman Payo, Maria; Duerinckx, Filip; Luchies, Jan-Marc; Lenes, Martijn; Poortmans, Jef (2019)

Characterization of absorption losses in rear side N-type polycrystalline silicon passivating contacts

Firat, Meric; Recaman Payo, Maria; Duerinckx, Filip; Luchies, Jan-Marc; Lenes, Martijn; Poortmans, Jef (2019)

Two-stage voltage amplifier design based on experimental Line-Tunnel FET data

Filho, Walter Goncalez; Martino, J.A.; Rangel, Roberto; Simoen, Eddy; Agopian, P.G.D.; Rooyackers, Rita; Claeys, Cor; Collaert, Nadine (2019)

Effect of growth parameters on the thermal conductivity of thin diamond films

Fiekd, D.E.; Pomeroy, J.W.; Ramaneti, Rajesh; Pobedinskas, Paulius; Haenen, Ken; Kuball, M. (2019)

Device-aware test: A new test approach towards DPPB

Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019-11)

Fine-scale mapping of cortical laminar activity during sleep slow oscillations using high-density linear silicon probes

Fiath, Richard; Raducanu, Bogdan; Musa, Silke; Andrei, Alexandru; Mora Lopez, Carolina; Welkenhuysen, Marleen; Ruther, Patrick; Aarts, Arno; Ulbert, Istvan (2019)

Hybrid PZT/Si TM/TE electro-optic phase modulators

Feutmba, Gilles F.; George, John P.; Alexander, Koen; Van Thourhout, Dries; Beeckman, Jeroen (2019)

Growth monitoring with submonolayer sensitivity via real-time thermal-conductance measurements

Ferrando Villalba, Pablo; Takegami, Daisuke; Abad, Llibertat; Ràfols-Ribé, Joan; Lopeandia, Aitor; Garcia, Gemma; Rodriguez-Viejo, Javier (2019)

Measuring device and material ZT in a thin-film Si-based thermoelectric microgenerator

Ferrando Villalba, Pablo; Perez-Marin, Antonio Pablo; Abad, Llibertat; Gonçalves Dalkiranis, Gustavo; Lopeandia, Aitor; Garcia, Gemma; Rodriguez-Viejo, Javier (2019)

A demonstration and evaluation of the use of cross-classified random-effects models for meta-analysis

Fernandez-Castilla, Belen; Maes, Marlies; Declercq, Lies; Jamshidi, Laleh; Beretvas, S. Natasha; Onghena, Patrick; Van den Noortgate, Wim (2019)

Concealed correlations meta-analysis: A new method for synthesizing standardized regression coefficients

Fernández Castilla, Bélen; Aloe, Ariel; Declercq, Lies; Jamshidi, Laleh; Beretvas, Natasha; Van den Noortgate, Wim (2019)

Preliminary Study on Hybrid Manufacturing of the Electrical-Mechanical Integrated Systems (EMIS) Assisted by the LCD Stereolithography Technology

Fei, Guanghai; Wei, Tiwei; Qimin, Shi; Guo, Yongjian; Oprins, Herman; Yang, Shoufeng (2019)

imec Publications: Recent submissions

Evaluating CoAP end to end security for constrained wireless sensor networks ﻿

Molybdenum as an Alternative Metal: Thin Film Properties ﻿

Imec's defect reduction strategies for EUV single exposed 32nm pitch line and space patterns ﻿

Log-based intrusion detection for Cloud Web applications using machine learning ﻿

Towards low-complexity wireless technology classification across multiple environments ﻿

Evaluation of alternative vertical transistors for 3D NAND applications ﻿

Opportunities and challenges in APT metrology for semiconductor applications ﻿

Low-frequency Noise and Defects in Copper and Ruthenium Resistors ﻿

Characterization of losses due to absorption in rear-side N-type poly-Si passivating contacts ﻿

Characterization of absorption losses in rear side N-type polycrystalline silicon passivating contacts ﻿

Two-stage voltage amplifier design based on experimental Line-Tunnel FET data ﻿

Effect of growth parameters on the thermal conductivity of thin diamond films ﻿

Device-aware test: A new test approach towards DPPB ﻿

Fine-scale mapping of cortical laminar activity during sleep slow oscillations using high-density linear silicon probes ﻿

Hybrid PZT/Si TM/TE electro-optic phase modulators ﻿

Growth monitoring with submonolayer sensitivity via real-time thermal-conductance measurements ﻿

Measuring device and material ZT in a thin-film Si-based thermoelectric microgenerator ﻿

A demonstration and evaluation of the use of cross-classified random-effects models for meta-analysis ﻿

Concealed correlations meta-analysis: A new method for synthesizing standardized regression coefficients ﻿

Preliminary Study on Hybrid Manufacturing of the Electrical-Mechanical Integrated Systems (EMIS) Assisted by the LCD Stereolithography Technology ﻿