Publication:
Validation of retention modeling as a trap-profiling technique for SiN-based charge-trapping memories
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1962 since deposited on 2021-10-18
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Acq. date: 2026-10-08
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Statistics
Views
1962 since deposited on 2021-10-18
3last month
1last week
Acq. date: 2026-10-08
Citations