Authors

Suhane, Amit; Arreghini, Antonio; Degraeve, Robin; Van den Bosch, Geert; Breuil, Laurent; Zahid, Mohammed; Jurczak, Gosia; De Meyer, Kristin; Van Houdt, Jan

ISSN

0741-3106

Issue

1

Journal

IEEE Electron Device Letters

Volume

31

Title

Validation of retention modeling as a trap-profiling technique for SiN-based charge-trapping memories

Publication type

Journal article

Embargo date

9999-12-31