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Influence of the Ge amount at the source on transistor efficiency of vertical gate all around TFETs for different conduction regimes
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Authors
Mendes Bordallo, Ciao Cesar
;
Sivieri, Victor B.
;
Martino, Joao Antonio
;
Agopian, Paula G. D.
;
Rooyackers, Rita
;
Vandooren, Anne
;
Simoen, Eddy
;
Thean, Aaron
;
Claeys, Cor
Conference
Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon -ULIS
Title
Influence of the Ge amount at the source on transistor efficiency of vertical gate all around TFETs for different conduction regimes
Publication type
Proceedings paper
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