Publication:

Extended Methodology to Determine SRAM Write Margin in Resistance-Dominated Technology Node

Date

2022
Journal article
https://doi.org/10.1109/TED.2022.3165738
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Author(s)

Liu, Hsiao-Hsuan
;
Salahuddin, Shairfe Muhammad  
;
Abdi, Dawit  
;
Chen, Rongmei  
;
Weckx, Pieter  
;
Matagne, Philippe  
;
Catthoor, Francky  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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