Browsing Conference contributions by imec author "7b18e4c3692e6ea995466961b29915662b414fea"
Now showing items 1-20 of 35
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BEOL compatible high retention perpendicular SOT-RAM device for SRAM replacement and AiMC
Couet, Sebastien; Rao, Siddharth; Van Beek, Simon; Nguyen, Van Dai; Garello, Kevin; Jayakumar, Ganesh; Costa, Diogo; Cai, Kaiming; Yasin, Farrukh; Crotti, Davide; Kar, Gouri Sankar (2021) -
Challenges with SOT-MRAM integration towards N5 node and beyond
Gupta, Mohit; Perumkunnil, Manu; Yasin, Farrukh; Mirabelli, Gioele; Garello, K.; Gupta, Anshul; Furnemont, Arnaud; Kar, Gouri Sankar (2022) -
Deterministic and field-free voltage-controlled MRAM for high performance and low power applications
Wu, Jackson; Kim, Woojin; Garello, Kevin; Yasin, Farrukh; Jayakumar, Ganesh; Couet, Sebastien; Carpenter, Robert; Kundu, Shreya; Rao, Siddharth; Crotti, Davide; Van Houdt, Jan; Groeseneken, Guido; Kar, Gouri Sankar (2020) -
Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node
Sakhare, Sushil; Perumkunnil, Manu; Huynh Bao, Trong; Rao, Siddharth; Kim, Woojin; Crotti, Davide; Yasin, Farrukh; Couet, Sebastien; Swerts, Johan; Kundu, Shreya; Yakimets, Dmitry; Baert, Rogier; Oh, Hyungrock; Spessot, Alessio; Mocuta, Anda; Kar, Gouri Sankar; Furnemont, Arnaud (2018) -
Enabling BEOL compatibility in top-pinned STT-MRAM
Carpenter, Robert; Swerts, Johan; Couet, Sebastien; Mertens, Sofie; Hon, Kwan; Liu, Enlong; Sankaran, Kiroubanand; Rao, Siddharth; Kim, Woojin; Garello, Kevin; Kundu, Shreya; Souriau, Laurent; Yasin, Farrukh; Houshmand Sharifi, Shamin; Van Elshocht, Sven; Crotti, Davide; Kar, Gouri Sankar (2019) -
Enabling CD SEM metrology for 5nm technology node and beyond
Lorusso, Gian; Ohashi, Takeyoshi; Yamaguchi, Astuko; Inoue, Osamu; Sutani, Takumichi; Horiguchi, Naoto; Boemmels, Juergen; Wilson, Chris; Briggs, Basoene; Tan, Chi Lim; Raymaekers, Tom; Delhougne, Romain; Van den Bosch, Geert; Di Piazza, Luca; Kar, Gouri Sankar; Furnemont, Arnaud; Fantini, Andrea; Donadio, Gabriele Luca; Souriau, Laurent; Crotti, Davide; Yasin, Farrukh; Appeltans, Raf; Rao, Siddharth; De Simone, Danilo; Rincon Delgadillo, Paulina; Leray, Philippe; Charley, Anne-Laure; Zhou, Daisy; Veloso, Anabela; Collaert, Nadine; Hasumi, Kazuhisa; Koshihara, Shunsuke; Ikota, Masami; Okagawa, Yutaka; Ishimoto, Toru (2017) -
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown
O'Sullivan, Barry; Van Beek, Simon; Roussel, Philippe; Rao, Siddharth; Kim, Woojin; Couet, Sebastien; Swerts, Johan; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
Feasibility analysis of embedded MRAM solutions at advanced process nodes
Perumkunnil, Manu; Gupta, Mohit; Rao, Siddharth; Kim, Woojin; Yasin, Farrukh; Couet, Sebastien; Furnemont, Arnaud; Kar, Gouri Sankar (2022) -
Field-free spin-orbit torque switching in magnetic tunnel junctions at sub-ns timescales
Krizakova, Viola; Grimaldi, E.; sala, giacomo; Yasin, Farrukh; Couet, Sebastien; Kar, Gouri Sankar; Garello, Kevin; Gambardella, Pietro (2020) -
High-density SOT-MRAM technology and design specifications for the embedded domain at 5nm node
Gupta, Mohit; Perumkunnil, Manu; Garello, Kevin; Rao, Siddharth; Yasin, Farrukh; Kar, Gouri Sankar; Furnemont, Arnaud (2020) -
IMAGING OF OVERLAY AND ALIGNMENT MARKERS UNDER OPAQUE LAYERS USING PICOSECOND LASER ACOUSTIC MEASUREMENTS AM: Advanced Metrology
Mehendale, M.; Antonelli, A.; Mair, R.; Mukundhan, P.; Bogdanowicz, Janusz; Charley, Anne-Laure; Leray, Philippe; Yasin, Farrukh; Crotti, Davide (2021) -
Impact of ambient temperature on the switching behavior of voltage-controlled perpendicular magnetic tunnel junction
Wu, Jackson; Kim, Woojin; Van Beek, Simon; Couet, Sebastien; Carpenter, Robert; Rao, Siddharth; Kundu, Shreya; Yasin, Farrukh; Van Houdt, Jan; Groeseneken, Guido; Crotti, Davide; Kar, Gouri Sankar (2020) -
Impact of self-heating on reliability predictions in STT-MRAM
Van Beek, Simon; O'Sullivan, Barry; Roussel, Philippe; Degraeve, Robin; Bury, Erik; Swerts, Johan; Couet, Sebastien; Souriau, Laurent; Kundu, Shreya; Rao, Siddharth; Kim, Woojin; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018) -
Impact of temperature on the switching behavior of scaled perpendicular magnetic tunnel junctions
Wu, Jackson; Kim, Woojin; Rao, Siddharth; Garello, Kevin; Couet, Sebastien; Liu, Enlong; Swerts, Johan; Kundu, Shreya; Souriau, Laurent; Yasin, Farrukh; Crotti, Davide; Kar, Gouri Sankar; Jochum, Johanna; Van Bael, Margriet; Van Houdt, Jan; Groeseneken, Guido (2017) -
LCDU optimization of STT-MRAM 50nm pitch MTJ pillars for process window improvement
Pak, Murat; Crotti, Davide; Yasin, Farrukh; Ercken, Monique; Halder, Sandip; De Simone, Danilo; Vanelderen, Pieter; Souriau, Laurent; Hody, Hubert; Kar, Gouri Sankar (2019) -
Liquid Memory and the Future of Data Storage
Rosmeulen, Maarten; Lockhart de la Rosa, Cesar Javier; Willems, Kherim; Fransen, Senne; Shih, Bing-Yang; Verreck, Devin; Kalangi, Vasu; Yasin, Farrukh; Philipsen, Harold; Set, Ying Ting; Ronchi, Nicolo; Van Roy, Wim; Henry, Olivier; Arreghini, Antonio; Van den Bosch, Geert; Furnemont, Arnaud (2022) -
Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM
Garello, Kevin; Yasin, Farrukh; Hody, Hubert; Couet, Sebastien; Souriau, Laurent; Houshmand Sharifi, Shamin; Swerts, Johan; Carpenter, Robert; Rao, Siddharth; Kim, Woojin; Wu, Jackson; Vudya Sethu, Kiran Kumar; Pak, Murat; Jossart, Nico; Crotti, Davide; Furnemont, Arnaud; Kar, Gouri Sankar (2019) -
Material and integration challenges of magnetic tunnel junctions in advanced spintronic applications
Swerts, Johan; Couet, Sebastien; Carpenter, Robert; Liu, Enlong; Hon, Kwan; Mertens, Sofie; Sankaran, Kiroubanand; Rao, Siddharth; Kim, Woojin; Garello, Kevin; Kundu, Shreya; Souriau, Laurent; Yasin, Farrukh; Sharif Md. Sadaf, Sharif; Van Elshocht, Sven; Crotti, Davide; Kar, Gouri Sankar (2019) -
Multi-pillar SOT-MRAM for Accurate Analog in-Memory DNN Inference
Doevenspeck, Jonas; Garello, Kevin; Rao, Siddharth; Yasin, Farrukh; Couet, Sebastien; Jayakumar, Ganesh; Debacker, Peter; Verkest, Diederik; Dehaene, Wim; Lauwereins, Rudy; Cosemans, Stefan; Mallik, Arindam; Kar, Gouri Sankar (2021) -
Pinhole defect characterization and modeling for STT-MRAM testing
Wu, Lizhou; Rao, Siddharth; Cardoso Medeiros, Guilherme; Taouil, Mottaqiallah; Marinissen, Erik Jan; Yasin, Farrukh; Couet, Sebastien; Hamdioui, Said; Kar, Gouri Sankar (2019-05)