Browsing Conference contributions by author "Fatermans, J."
Now showing items 1-3 of 3
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Atom column detection from STEM images using the maximum a posteriori probability rule
Fatermans, J.; den Dekker, A.J.; O'Leary, C.M.; Nellist, P.D.; Van Aert, S. (2019) -
Bayesian analysis of noisy scanning transmission electron microscopy images for single atom detection
Fatermans, J.; den Dekker, Arnold Jan; Müller-Caspary, K.; Lobato, I.; Van Aert, S. (2018) -
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Fatermans, J.; den dekker, Arnold Jan; Müller-Caspary, K.; Lobato, I.; Van Aert, Sandra (2018)