Browsing Conference contributions by imec author "f6814dc2ba9eb9208d4735f879d2b56ad8e328e4"
Now showing items 1-20 of 59
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BEOL compatible double-MTJ STT-MRAM for ultra-low write-currents
Carpenter, Robert; Rao, Siddharth; Couet, Sebastien; Kim, Woojin; Swerts, Johan; Crotti, Davide; Kar, Gouri Sankar (2020) -
BEOL compatible high retention perpendicular SOT-RAM device for SRAM replacement and AiMC
Couet, Sebastien; Rao, Siddharth; Van Beek, Simon; Nguyen, Van Dai; Garello, Kevin; Jayakumar, Ganesh; Costa, Diogo; Cai, Kaiming; Yasin, Farrukh; Crotti, Davide; Kar, Gouri Sankar (2021) -
BEOL compatible top pinned magnetic tunnel junctions with a synthetic ferromagnetic pinning layer design
Swerts, Johan; Liu, Enlong; Couet, Sebastien; Mertens, Sofie; Carpenter, Robert; Kim, Woojin; Rao, Siddharth; Garello, Kevin; Van Elshocht, Sven; Kar, Gouri Sankar (2018) -
Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2021) -
Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Wu, Lizhou; Rao, Siddharth; Taouil, Mottaqiallah; Marinissen, Erik Jan; Kar, Gouri Sankar; Hamdioui, Said (2020) -
CMP process steps for the fabrication of spin-transfer torque magnetic random access memory
Tsvetanova, Diana; Heylen, Nancy; Teugels, Lieve; Crotti, Davide; Donadio, Gabriele Luca; Kar, Gouri Sankar; Struyf, Herbert; Souriau, Laurent; Mertens, Sofie; Swerts, Johan; Couet, Sebastien; Lin, Tsann; Paraschiv, Vasile; Kim, Woojin; Rao, Siddharth (2016) -
Cross-layer design and analysis of al ow power, high density STT-MRAM for embedded systems
Perumkunnil, Manu; Sakhare, Sushil; Huynh Bao, Trong; Rao, Siddharth; Kim, Woojin; Tenllado, Christian; Gomez, Jose Ignacio; Kar, Gouri Sankar; Furnemont, Arnaud; Catthoor, Francky (2017) -
Cryogenic cooling post MgO promoting the free layer coercivity and TMR in perpendicular bottom pinned Co/Ni STT-MRAM device stacks
Swerts, Johan; Mertens, Sofie; Couet, Sebastien; Lin, Tsann; Liu, Enlong; Rao, Siddharth; Kim, Woojin; Van Elshocht, Sven; Kar, Gouri Sankar; Furnemont, Arnaud; Nishimura, Kazumasa; Okuyama, Hiroki; Seino, Takuya; Tsunekawa, Koji (2016) -
Deterministic and field-free voltage-controlled MRAM for high performance and low power applications
Wu, Jackson; Kim, Woojin; Garello, Kevin; Yasin, Farrukh; Jayakumar, Ganesh; Couet, Sebastien; Carpenter, Robert; Kundu, Shreya; Rao, Siddharth; Crotti, Davide; Van Houdt, Jan; Groeseneken, Guido; Kar, Gouri Sankar (2020) -
Device Aware Diagnosis for Unique Defects in STT-MRAMs
Aouichi, Ahmed; Yuan, Sicong; Fieback, Moritz; Rao, Siddharth; Kim, Woojin; Marinissen, Erik Jan; Couet, Sebastien; Taouil, Mottaqiallah; Hamdioui, Said (2023) -
Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Yuan, Sicong; Taouil, Mottaqiallah; Fieback, Moritz; Xun, Hanzhi; Marinissen, Erik Jan; Kar, Gouri Sankar; Rao, Siddharth; Couet, Sebastien; Hamdioui, Said (2023) -
Device-aware test: A new test approach towards DPPB
Fieback, Moritz; Wu, Lizhou; Cardoso Medeiros, Guilherme; Aziza, Hassen; Rao, Siddharth; Marinissen, Erik Jan; Taouil, Mottaqiallah; Hamdioui, Said (2019-11) -
Diffusion control in top-pinned STT-MRAM devices
Carpenter, Robert; Swerts, Johan; Couet, Sebastien; Mertens, Sofie; Liu, Enlong; Kim, Woojin; Rao, Siddharth; Kundu, Shreya; Kar, Gouri Sankar (2019) -
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution
Van Beek, Simon; Rao, Siddharth; Kundu, Shreya; Kim, Woojin; O'Sullivan, Barry J.; Cosemans, Stefan; Yasin, Farukh; Carpenter, Robert; Couet, Sebastien; Sharifi, Shamin H.; Jossart, Nico; Crotti, Davide; Kar, Gouri (2021) -
Electrical modeling of STT-MRAM defects
Wu, Lizhou; Taouil, Mottaqiallah; Rao, Siddharth; Marinissen, Erik Jan; Hamdioui, Said (2018-11) -
Enablement of STT-MRAM as last level cache for the high performance computing domain at the 5nm node
Sakhare, Sushil; Perumkunnil, Manu; Huynh Bao, Trong; Rao, Siddharth; Kim, Woojin; Crotti, Davide; Yasin, Farrukh; Couet, Sebastien; Swerts, Johan; Kundu, Shreya; Yakimets, Dmitry; Baert, Rogier; Oh, Hyungrock; Spessot, Alessio; Mocuta, Anda; Kar, Gouri Sankar; Furnemont, Arnaud (2018) -
Enabling BEOL compatibility in top-pinned STT-MRAM
Carpenter, Robert; Swerts, Johan; Couet, Sebastien; Mertens, Sofie; Hon, Kwan; Liu, Enlong; Sankaran, Kiroubanand; Rao, Siddharth; Kim, Woojin; Garello, Kevin; Kundu, Shreya; Souriau, Laurent; Yasin, Farrukh; Houshmand Sharifi, Shamin; Van Elshocht, Sven; Crotti, Davide; Kar, Gouri Sankar (2019) -
Enabling CD SEM metrology for 5nm technology node and beyond
Lorusso, Gian; Ohashi, Takeyoshi; Yamaguchi, Astuko; Inoue, Osamu; Sutani, Takumichi; Horiguchi, Naoto; Boemmels, Juergen; Wilson, Chris; Briggs, Basoene; Tan, Chi Lim; Raymaekers, Tom; Delhougne, Romain; Van den Bosch, Geert; Di Piazza, Luca; Kar, Gouri Sankar; Furnemont, Arnaud; Fantini, Andrea; Donadio, Gabriele Luca; Souriau, Laurent; Crotti, Davide; Yasin, Farrukh; Appeltans, Raf; Rao, Siddharth; De Simone, Danilo; Rincon Delgadillo, Paulina; Leray, Philippe; Charley, Anne-Laure; Zhou, Daisy; Veloso, Anabela; Collaert, Nadine; Hasumi, Kazuhisa; Koshihara, Shunsuke; Ikota, Masami; Okagawa, Yutaka; Ishimoto, Toru (2017) -
Evidence of magnetostrictive effects on STT-MRAM performances by atomistic and spin modeling
Sankaran, Kiroubanand; Swerts, Johan; Carpenter, Robert; Couet, Sebastien; Garello, Kevin; Evans, Richard F. L.; Rao, Siddharth; Kim, Woojin; Kundu, Shreya; Crotti, Davide; Kar, Gouri Sankar; Pourtois, Geoffrey (2018) -
Extended RVS characterisation of STT-MRAM devices: Enabling detection of AP/P switching and breakdown
O'Sullivan, Barry; Van Beek, Simon; Roussel, Philippe; Rao, Siddharth; Kim, Woojin; Couet, Sebastien; Swerts, Johan; Yasin, Farrukh; Crotti, Davide; Linten, Dimitri; Kar, Gouri Sankar (2018)