Browsing Conference contributions by title

I-module technology: evaluation and evolution

Govaerts, Jonathan; Boulord, Caroline; Fisher, Mark; Beaucarne, Guy; Gordon, Ivan; Poortmans, Jef; Baert, Kris (2013)

I/O thick oxide device integration using Diffusion and Gate Replacement (D&GR) gate stack integration

Ritzenthaler, Romain; Schram, Tom; Cho, Moon Ju; Mocuta, Anda; Horiguchi, Naoto; Thean, Aaron; Spessot, Alessio; Caillat, Christian; Aoulaiche, Marc; Fazan, Pierre; Noh, Kyung Bong; Son, Yunik (2015)

IamNN: Iterative and adaptive mobile neural network for efficient image classification

Leroux, Sam; Simoens, Pieter; Dhoedt, Bart; Molchanov, P.; Breuel, T.; Kautz, J. (2018-04)

IBBT-COPLINTHO innovative communication platforms for interactive eHomeCare

Ackaert, Ann; Van Hoecke, Sofie; Moerman, Ingrid; Laermans, Eric; Van Boxstael, Koen; Demeester, Piet; De Moor, Georges; Buysse, Heidi; Spinhof, Lonneke; De Grooff, Dirk; Leys, Mark; De Rouck, Sofie; Peeters, Maarten; Dumortier, Jos; Agten, Stijn; Lamotte, Wim (2005-06)

IC-package interaction

Vandevelde, Bart; Ivankovic, Andrej; Debecker, Bjorn; Lofrano, Melina; Vanstreels, Kris; Guo, Wei; Cherman, Vladimir; Gonzalez, Mario; Van der Plas, Geert; De Wolf, Ingrid; Beyne, Eric; Tokei, Zsolt (2013)

ICT for development in a post-2015 world: How to conceptualise ICT4D in the context of the sustainable development goals

Rothe, Franz Ferdinand (2018)

Idea: Visual analytics for web security

Le Pochat, Victor; Van Goethem, Tom; Joosen, Wouter (2018)

Identification and diagnostic of a photovoltaic module based on outdoor measurements

Spagnuolo, Giovanni; Lappalainen, Kari; Valkealahti, Seppo; Manganiello, Patrizio (2019)

Identification of a crystal detector using a block structres nonlinear feedback model

Schoukens, Johan; Gommé, Liesbeth; Van Moer, Wendy; Rolain, Yves (2007)

Identification of continuous-time noise models

Pintelon, R.; Schoukens, J.; Rolain, Y.; Cauberghe, B.; Parloo, E.; Guillaume, P. (2004)

Identification of critical parameters for plasma process-induced damage in 130 and 100 nm CMOS technologies

Van den Bosch, Geert; De Jaeger, Brice; Tokei, Zsolt; Groeseneken, Guido (2002)

Identification of critical regions in AlGaN/GaN-on-Si Schottky barrier diode using Electron beam induced current method

Priesol, Juraj; Satka, Alexander; Chvala, A.; Stoffels, Steve; Decoutere, Stefaan (2017-05)

Identification of deep levels associated with extended and point defects in GeSn epitaxial layers using DLTS

Gupta, Somya; Simoen, Eddy; Vrielinck, Henk; Merckling, Clement; Vincent, Benjamin; Gencarelli, Federica; Loo, Roger; Heyns, Marc (2013)

Identification of distributed parameter systems: a case study

Pintelon, R.; Guillaume, P.; Rolain, Y. (2003)

Identification of gap soliton through phase measurement

Gorza, S.-P.; Cambournac, C.; Emplit, P.; Haelterman, M.; Taillaert, Dirk; Maes, B.; Baets, Roel (2005-09)

Identification of key factors to reduce stress induced during 3D IC's assembly

Lofrano, Melina; Gonzalez, Mario; Cherman, Vladimir (2016)

Identification of linear systems with nonlinear distortions

Schoukens, J.; Pintelon, R.; Dobrowiecki, T.; Rolain, Y. (2003)

Identification of material damping from broadband modal analysis experiments

Pintelon, R.; De Belder, K.; Guillaume, P.; Vanlanduit, S.; Rolain, Y. (2003)

Identification of Sn-V related acceptor levels in irradiated tin-doped n-type silicon

Simoen, Eddy; Claeys, Cor; Neimash, V. B.; Kraitchinskii, A.; Kras'ko, M.; Puzenko, O.; Blondeel, A.; Clauws, P.; Pattyn, Hugo; Koops, G.E.J.; Pattyn, H. (2000)

Identification of superior ethanol tolerant industrial yeasts using droplet microfluidics

Vervoort, Yannick; Wiederkehr, Rodrigo Sergio; Stakenborg, Tim; Fiorini, Paolo; Lagae, Liesbet; Verstrepen, Kevin (2015)