Recently added

Multifractal analysis of line-edge roughness

Costantoudis, Vassilios; Papaverios, George; Lorusso, Gian; Rutigliani, Vito; Van Roey, Frieda; Gogolides, Evangelos (2018)

Forensic Oxford nanopore sequencing

Cornelis, Senne (2018)

Computational nanometrology of line-edge roughness: noise effectd, cross-line correlations and the role of etch transfer

Constantoudis, Vassilios; Papavieros, George; Lorusso, Gian; Rutigliani, Vito; Van Roey, Frieda; Gogolides, Evangelos (2018)

Analysis of activation constraints and their effect on demand-side flexibility allocations

Coninx, Kristof; Deconinck, Geert; Holvoet, Tom (2018)

Photoémission à haute énergie en laboratoire : Une nouvelle aire de développement

Conard, Thierry; Coultas, Sarah; Deecks, Christopher; Erikkson, Susanna; Mann, Jennifer (2018)

Semiconductor technologies for next generation mobile communications

Collaert, Nadine; Alian, AliReza; Chen, Shih-Hung; Deshpande, Veeresh Vidyadhar; Ingels, Mark; Putcha, Vamsi; Sibaja-Hernandez, Arturo; van Liempd, Barend; Vais, Abhitosh; Vandooren, Anne; Walke, Amey; Witters, Liesbeth; Yu, Hao; Linten, Dimitri; Parvais, Bertrand; Wambacq, Piet; Waldron, Niamh (2018-11)

Semiconductor technologies for 5G applications

Collaert, Nadine (2018-11)

First-principles perspective on poling mechanisms and ferroelectric/ antiferroelectric behavior of Hf1-xZrxO2 for FEFET applications

Clima, Sergiu; McMitchell, Sean; Florent, Karine; Nyns, Laura; Popovici, Mihaela Ioana; Ronchi, Nicolo; Di Piazza, Luca; Van Houdt, Jan; Pourtois, Geoffrey (2018)

De-pseudonomyzation of smart metering data: analysis and countermeasures

Cleemput, Sara; Mustafa, Mustafa; Marin, Eduard; Preneel, Bart (2018)

Are extended defects a show stopper for future III-V CMOS technologies?

Claeys, Cor; Hsu, Brent; He, Liang; Mols, Yves; Kunert, Bernardette; Langer, Robert; Waldron, Niamh; Eneman, Geert; Collaert, Nadine; Heyns, Marc; Simoen, Eddy (2018-06)

Two-tone FSK mModulation for SWIPT

Claessens, Steven; Rajabi, Mohammed; Ning, Pan; Schreurs, Dominique; Pollin, Sofie (2018)

Massive MIMO for SWIPT: A measurement-based study of precoding

Claessens, Steven; Chen, Cheng-Ming; Schreurs, Dominique; Pollin, Sofie (2018)

GdAlO3: a promising high-k dielectric for reliable gate stacks at low thermal budget

Claes, Dieter; Franco, Jacopo; Collaert, Nadine; Linten, Dimitri; Heyns, Marc (2018-12)

Computing with spin waves: from magnetoelectric transducers to majority gates

Ciubotaru, Florin; Tierno, Davide; Talmelli, Giacomo; Ahmad, Hasnain; Costa, Diogo; Radu, Iuliana; Devolder, Thibaut; Adelmann, Christoph (2018)

Transducers and logic gates for computing with spin waves

Ciubotaru, Florin; Talmelli, Giacomo; Vanderveken, Frederic; Tierno, Davide; Radu, Iuliana; Devolder, Thibaut; Adelmann, Christoph (2018)

First experimental demonstration of a scalable linear majority gate based on spin waves

Ciubotaru, Florin; Talmelli, Giacomo; Devolder, Thibaut; Zografos, Odysseas; Heyns, Marc; Adelmann, Christoph; Radu, Iuliana (2018)

Spin waves towards real applications

Ciubotaru, Florin; Talmelli, Giacomo; Adelmann, Christoph; Radu, Iuliana (2018)

Impact of litho-patterning variations on the electrical performance and variability of advanced interconnects

Ciofi, Ivan; Roussel, Philippe; Baert, Rogier; Kocaay, Deniz; Contino, Antonino; Croes, Kristof; Saad, Yves; Gao, Weimin; Moroz, Victor; Wilson, Chris; Mocuta, Dan; Tokei, Zsolt (2018)

RC modeling, scaling trends and mitigation approaches

Ciofi, Ivan; Roussel, Philippe; Baert, Rogier; Contino, Antonino; Gupta, Anshul; Croes, Kristof; Wilson, Chris; Mocuta, Dan; Tokei, Zsolt (2018)

3-D device electrothermal simulation for analysis of multifinger power HEMTs

Chvála, Aleš; Marek, Juraj; Satka, Alexander; Priesol, Juraj; Príbytnŭ, Patrik; Donoval, Daniel; Stoffels, Steve; Posthuma, Niels; Decoutere, Stefaan (2018)

Conference contributions: Recent submissions

Multifractal analysis of line-edge roughness ﻿

Forensic Oxford nanopore sequencing ﻿

Computational nanometrology of line-edge roughness: noise effectd, cross-line correlations and the role of etch transfer ﻿

Analysis of activation constraints and their effect on demand-side flexibility allocations ﻿

Photoémission à haute énergie en laboratoire : Une nouvelle aire de développement ﻿

Semiconductor technologies for next generation mobile communications ﻿

Semiconductor technologies for 5G applications ﻿

First-principles perspective on poling mechanisms and ferroelectric/ antiferroelectric behavior of Hf1-xZrxO2 for FEFET applications ﻿

De-pseudonomyzation of smart metering data: analysis and countermeasures ﻿

Are extended defects a show stopper for future III-V CMOS technologies? ﻿

Two-tone FSK mModulation for SWIPT ﻿

Massive MIMO for SWIPT: A measurement-based study of precoding ﻿

GdAlO3: a promising high-k dielectric for reliable gate stacks at low thermal budget ﻿

Computing with spin waves: from magnetoelectric transducers to majority gates ﻿

Transducers and logic gates for computing with spin waves ﻿

First experimental demonstration of a scalable linear majority gate based on spin waves ﻿

Spin waves towards real applications ﻿

Impact of litho-patterning variations on the electrical performance and variability of advanced interconnects ﻿

RC modeling, scaling trends and mitigation approaches ﻿

3-D device electrothermal simulation for analysis of multifinger power HEMTs ﻿