Recently added

Reference-free, in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis

Hoenicke, Philipp; Mueller, Matthias; Detlefs, Blanka; Fleischmann, Claudia; Beckhoff, Burkhard (2014)

Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films

Hoenicke, Philipp; Fleischmann, Claudia; Hermann, Peter; Beckhoff, Burkhard (2014)

Gate double patterning strategies for 10nm node FinFET devices

Hody, Hubert; Paraschiv, Vasile; Hellin, David; Vandeweyer, Tom; Boccardi, Guillaume; Xu, Kaidong (2014)

High Ge content SiGe thin films: growth, properties and integration

Hikavyy, Andriy; Witters, Liesbeth; Mertens, Hans; Bender, Hugo; Favia, Paola; Loo, Roger (2014)

Use of X-ray techniques in the development and production of novel transistor structures

Hikavyy, Andriy; Rosseel, Erik; Witters, Liesbeth; Mertens, Hans; Ryan, Paul; Langer, Robert; Loo, Roger (2014)

Application of selective epitaxial growth in the sub 20 nm FinFET device fabrication

Hikavyy, Andriy; Rosseel, Erik; Eneman, Geert; Favia, Paola; Loo, Roger (2014)

High Ge content SiGe thin films: growth, properties and integration

Hikavyy, Andriy; Rosseel, Erik; Dhayalan, Sathish Kumar; Witters, Liesbeth; Mertens, Hans; Bender, Hugo; Favia, Paola; Loo, Roger (2014)

New materials for advanced CMOS scaling

Heyns, Marc (2014)

Innovation in nano electronics for a green and sustainable future

Heyns, Marc (2014)

ALD applications in advanced CMOS scaling

Heyns, Marc (2014)

CMOS scaling beyond the Si roadmap

Heyns, Marc (2014)

Resolving load balancing issues in BWA on NUMA multicore architectures

Herzeel, Charlotte; Ashby, Tom; Costanza, Pascal; De Meuter, Wolfgang (2014)

High frequency outdoor measurements of photovoltaic modules using an innovative measurement set-up

Herteleer, Bert; Morel, B.; Huyck, Bart; Cappelle, Jan; Appels, Reinhart; Lefevre, Buvana; Catthoor, Francky; Driesen, Johan (2014)

Measurement of spatial and temporal photovoltaic module temperature

Herteleer, Bert; Goverde, Hans; Catthoor, Francky; Driesen, Johan; Cappelle, Jan (2014)

A 9.1-12.7 GHz VCO in 28nm CMOS with a bottom-pinning bias technique for digital varactor stress reduction

Hershberg, Benjamin; Raczkowski, Kuba; Vaesen, Kristof; Craninckx, Jan (2014)

Imagers based on organic photodiodes

Heremans, Paul; Moet, Date; Malinowski, Pawel; Kumar, Abhishek; van der Steen, Jan-Laurens; Myny, Kris; Gelinck, Gerwin (2014)

Thin-film transistor circuits in sensor arrays and RF tags

Heremans, Paul (2014)

Thin-film and printed electronics on plastic

Heremans, Paul (2014)

Thin-film transistors on plastic: manufacturability and applications

Heremans, Paul (2014)

Flexible electronics for wearable applications

Heremans, Paul (2014)

Conference contributions: Recent submissions

Reference-free, in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis ﻿

Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films ﻿

Gate double patterning strategies for 10nm node FinFET devices ﻿

High Ge content SiGe thin films: growth, properties and integration ﻿

Use of X-ray techniques in the development and production of novel transistor structures ﻿

Application of selective epitaxial growth in the sub 20 nm FinFET device fabrication ﻿

High Ge content SiGe thin films: growth, properties and integration ﻿

New materials for advanced CMOS scaling ﻿

Innovation in nano electronics for a green and sustainable future ﻿

ALD applications in advanced CMOS scaling ﻿

CMOS scaling beyond the Si roadmap ﻿

Resolving load balancing issues in BWA on NUMA multicore architectures ﻿

High frequency outdoor measurements of photovoltaic modules using an innovative measurement set-up ﻿

Measurement of spatial and temporal photovoltaic module temperature ﻿

A 9.1-12.7 GHz VCO in 28nm CMOS with a bottom-pinning bias technique for digital varactor stress reduction ﻿

Imagers based on organic photodiodes ﻿

Thin-film transistor circuits in sensor arrays and RF tags ﻿

Thin-film and printed electronics on plastic ﻿

Thin-film transistors on plastic: manufacturability and applications ﻿

Flexible electronics for wearable applications ﻿

Reference-free, in-depth characterization of nanoscaled systems with advanced grazing incidence X-ray fluorescence analysis

Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films

Gate double patterning strategies for 10nm node FinFET devices

High Ge content SiGe thin films: growth, properties and integration

Use of X-ray techniques in the development and production of novel transistor structures

Application of selective epitaxial growth in the sub 20 nm FinFET device fabrication

High Ge content SiGe thin films: growth, properties and integration

New materials for advanced CMOS scaling

Innovation in nano electronics for a green and sustainable future

ALD applications in advanced CMOS scaling

CMOS scaling beyond the Si roadmap

Resolving load balancing issues in BWA on NUMA multicore architectures

High frequency outdoor measurements of photovoltaic modules using an innovative measurement set-up

Measurement of spatial and temporal photovoltaic module temperature

A 9.1-12.7 GHz VCO in 28nm CMOS with a bottom-pinning bias technique for digital varactor stress reduction

Imagers based on organic photodiodes

Thin-film transistor circuits in sensor arrays and RF tags

Thin-film and printed electronics on plastic

Thin-film transistors on plastic: manufacturability and applications

Flexible electronics for wearable applications