Recently added

Plastic electronics technologies and applications

Heremans, Paul (2014)

Electronics on plastic foil for applications in flexible OLED displays, sensor arrays and circuits

Heremans, Paul (2014)

Invited Tutorial: TCAD on ESD symposium

Hellings, Geert (2014)

Modelling and mitigation of time-zero variability in sub-16nm FinFET-based STT-MRAM memories

Hartmann, Matthias; Kukner, Halil; Agrawal, Prashant; Raghavan, Praveen; Van der Perre, Liesbet; Dehaene, Wim (2014)

Diamond tips for electrical AFM measurements with sub-nanometer resolution

Hantschel, Thomas; Tsigkourakos, Menelaos; Paredis, Kristof; Eyben, Pierre; Nuytten, Thomas; Schulze, Andreas; Vandervorst, Wilfried (2014)

Overcoated diamond tips for nanometer-scale semiconductor device characterization

Hantschel, Thomas; Tsigkourakos, Menelaos; Kluge, Julia; Werner, Thilo; Zha, Lichen; Paredis, Kristof; Eyben, Pierre; Vandervorst, Wilfried (2014-09)

Progress on background signal analysis of bare wafer inspection systems based on light scattering for III/V epitaxial growth monitoring

Halder, Sandip; Mols, Yves; Van Den Heuvel, Dieter; Van Puymbroeck, Jan; Caymax, Matty; Vancoille, Eric; Nieuborg, Nancy; Bast, Gerhard; Simpson, Gavin; Peikert, Milko; Polli, Marco; Ulea, Neli; Seong, Ho Yoo (2014)

Profiling of border traps at GeSn and high-K oxide interface

Gupta, Somya; Simoen, Eddy; Dobri, Adam; Vrielinck, Henk; Lauwaert, Johan; Merckling, Clement; Gencarelli, Federica; Shimura, Yosuke; Loo, Roger; Heyns, Marc (2014-10)

Profiling of border traps at GeSn and high-K oxide interface

Gupta, Somya; Simoen, Eddy; Dobri, Adam; Vrielinck, Henk; Lauwaert, Johan; Merckling, Clement; Gencarelli, Federica; Shimura, Yosuke; Loo, Roger; Heyns, Marc (2014)

Impact of 3D integration on 7nm high mobility channel devices operating in the ballistic regime

Guo, Wei; Choi, Munkang; Rouhi Najaf Abadi, Alireza; Moroz, Victor; Van der Plas, Geert; Absil, Philippe; Beyne, Eric (2014)

Soldering MWT solar cells into solar modules

Guneser, Tahir; Govaerts, Jonathan; van der Heide, Arvid; Dewallef, Stefan; Borgers, Tom; Gordon, Ivan; Poortmans, Jef (2014)

Defect reduction and defect stability in imec's 14nm half pitch chemo-epitaxy DSA flow

Gronheid, Roel; Rincon Delgadillo, Paulina; Pathangi Sriraman, Hari; Van Den Heuvel, Dieter; Parnell, Doni; Chan, BT; Lee, Yu-tsung; Van Look, Lieve; Cao, Yi; Her, YoungJun; Lin, Guanyang; Harukawa, Ryoto; Nagaswami, Venkat; D'Urzo, Lucia; Somervell, Mark; Nealey, Paul (2014)

Readying directed self-assembly for patterning in semiconductor manufacturing

Gronheid, Roel; Chan, BT; Pathangi Sriraman, Hari; Van Den Heuvel, Dieter; MKuppuswamy, Vijaya Kumar; Doise, Jan; Bekaert, Joost; Rincon Delgadillo, Paulina; Nealey, Paul; Cao, Yi; Her, YoungJun; Sayan, Safak; Parnell, Doni; Romo Negreira, Ainhoa; Somervell, Mark (2014)

Process optimization of templated DSA flows

Gronheid, Roel; Bekaert, Joost; MKuppuswamy, Vijaya Kumar; Vandenbroeck, Nadia; Doise, Jan; Cao, Yi; Lin, Guanyang; Sayan, Safak; Parnell, Doni; Somervell, Mark (2014)

BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities

Groeseneken, Guido; Franco, Jacopo; Cho, Moon Ju; Kaczer, Ben; Toledano Luque, Maria; Roussel, Philippe; Kauerauf, Thomas; Alian, AliReza; Mitard, Jerome; Arimura, Hiroaki; Lin, Dennis; Waldron, Niamh; Sioncke, Sonja; Witters, Liesbeth; Mertens, Hans; Ragnarsson, Lars-Ake; Heyns, Marc; Collaert, Nadine; Thean, Aaron; Steegen, An (2014-12)

Characterization and modeling of charge trapping: From single defects to devices

Grasser, T.; Rzepa, G.; Waltl, M.; Goes, W.; Rott, K.; Rott, G.; Reisinger, H.; Franco, Jacopo; Kaczer, Ben (2014)

Energy yield prediction model for PV modules including spatial and temporal effects

Goverde, Hans; Herteleer, Bert; Anagnostos, Dimitrios; Kose, Gulcin; Goossens, Dirk; Aldaladi, Bader; Govaerts, Jonathan; Baert, Kris; Catthoor, Francky; Driesen, Johan; Poortmans, Jef (2014)

Role of the Ta scavenger electrode in the excellent switching control and reliability of a scalable low-current operated TiN\Ta2O5\Ta RRAM device

Goux, Ludovic; Fantini, Andrea; Redolfi, Augusto; Chen, Michael; Shi, FangFang; Degraeve, Robin; Chen, Yangyin; Witters, Thomas; Groeseneken, Guido; Jurczak, Gosia (2014)

CBRAM technology development at imec

Goux, Ludovic (2014)

Supercontinuum generation in hydrogenated amorphous silicon waveguides in the femtosecond regime

Gorza, S.P; Leo, Francois; Kuyken, Bart; Selvaraja, Shankar; Roelkens, Gunther; Baets, Roel; Emplit, Ph.; Massar, S.; Safioui, J. (2014)

Conference contributions: Recent submissions

Plastic electronics technologies and applications ﻿

Electronics on plastic foil for applications in flexible OLED displays, sensor arrays and circuits ﻿

Invited Tutorial: TCAD on ESD symposium ﻿

Modelling and mitigation of time-zero variability in sub-16nm FinFET-based STT-MRAM memories ﻿

Diamond tips for electrical AFM measurements with sub-nanometer resolution ﻿

Overcoated diamond tips for nanometer-scale semiconductor device characterization ﻿

Progress on background signal analysis of bare wafer inspection systems based on light scattering for III/V epitaxial growth monitoring ﻿

Profiling of border traps at GeSn and high-K oxide interface ﻿

Profiling of border traps at GeSn and high-K oxide interface ﻿

Impact of 3D integration on 7nm high mobility channel devices operating in the ballistic regime ﻿

Soldering MWT solar cells into solar modules ﻿

Defect reduction and defect stability in imec's 14nm half pitch chemo-epitaxy DSA flow ﻿

Readying directed self-assembly for patterning in semiconductor manufacturing ﻿

Process optimization of templated DSA flows ﻿

BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities ﻿

Characterization and modeling of charge trapping: From single defects to devices ﻿

Energy yield prediction model for PV modules including spatial and temporal effects ﻿

Role of the Ta scavenger electrode in the excellent switching control and reliability of a scalable low-current operated TiN\Ta2O5\Ta RRAM device ﻿

CBRAM technology development at imec ﻿

Supercontinuum generation in hydrogenated amorphous silicon waveguides in the femtosecond regime ﻿

Plastic electronics technologies and applications

Electronics on plastic foil for applications in flexible OLED displays, sensor arrays and circuits

Invited Tutorial: TCAD on ESD symposium

Modelling and mitigation of time-zero variability in sub-16nm FinFET-based STT-MRAM memories

Diamond tips for electrical AFM measurements with sub-nanometer resolution

Overcoated diamond tips for nanometer-scale semiconductor device characterization

Progress on background signal analysis of bare wafer inspection systems based on light scattering for III/V epitaxial growth monitoring

Profiling of border traps at GeSn and high-K oxide interface

Profiling of border traps at GeSn and high-K oxide interface

Impact of 3D integration on 7nm high mobility channel devices operating in the ballistic regime

Soldering MWT solar cells into solar modules

Defect reduction and defect stability in imec's 14nm half pitch chemo-epitaxy DSA flow

Readying directed self-assembly for patterning in semiconductor manufacturing

Process optimization of templated DSA flows

BTI reliability of advanced gate stacks for beyond silicon devices: challenges and opportunities

Characterization and modeling of charge trapping: From single defects to devices

Energy yield prediction model for PV modules including spatial and temporal effects

Role of the Ta scavenger electrode in the excellent switching control and reliability of a scalable low-current operated TiN\Ta2O5\Ta RRAM device

CBRAM technology development at imec

Supercontinuum generation in hydrogenated amorphous silicon waveguides in the femtosecond regime