Reference survey spectra of elemental solid measured with Cr K-alpha photons as a tool for Quases analysis (4): Group III and IV elements (B, Al, In, C, Si, Ge, Sn, Pb)

Abstract

Several pure bulk materials were analyzed using laboratory-based hard x-ray photoelectron spectroscopy. The spectra are surveys measured using monochromatic Cr K-alpha radiation at 5414.8 eV after removal of surface contamination or oxidation. These aim to be references for inelastic background analysis using the Tougaard method.