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STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes
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Authors
Garcia-Redondo, F.
;
Rao, Siddharth
;
Gupta, Mohit
;
Perumkunnil, Manu
;
Xiang, Yang
;
Abdi, Dawit
;
Van Beek, Simon
;
Couet, Sebastien
;
Garcia Bardon, Marie
DOI
10.1109/ESSDERC59256.2023.10268481
EISBN
979-8-3503-0423-7
ISSN
1930-8876
Conference
IEEE 53rd European Solid-State Device Research Conference (ESSDERC)
Journal
N/A
Title
STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes
Publication type
Proceedings paper
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2
20.500.12860/43178.2
*
2024-05-06T14:45:23Z
validation by library/open access desk
1
20.500.12860/43178
2023-11-24T17:33:10Z
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