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Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency
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Authors
Chuang, Po-Yao
;
Lorenzelli, Francesco
;
Marinissen, Erik Jan
DOI
10.1109/ITC-Asia58802.2023.10301169
EISBN
979-8-3503-1281-2
ISSN
2768-0681
Conference
7th IEEE International Test Conference in Asia (ITC-Asia)
Journal
N/A
Title
Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency
Publication type
Proceedings paper
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2
20.500.12860/43250.2
*
2024-06-06T07:50:50Z
validation by library/open access desk
1
20.500.12860/43250
2023-12-14T17:35:40Z
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