Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Articles
Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors
Publication:
Low-Frequency Noise Characterization of BEOL Metal-Insulator-Metal Capacitors
Copy permalink
Date
2025-APR
Journal article
https://doi.org/10.1109/TED.2025.3542748
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Giusi, G.
;
Saini, Nishant
;
Croes, K.
;
Ciofi, I.
;
Scandurra, G.
;
Ciofi, C.
;
Tierno, D.
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Abstract
Description
Metrics
Views
146
since deposited on 2025-04-13
2
last month
1
last week
Acq. date: 2026-01-06
Citations
Metrics
Views
146
since deposited on 2025-04-13
2
last month
1
last week
Acq. date: 2026-01-06
Citations