Browsing Articles by author "Nafria, Montserrat"
Now showing items 1-6 of 6
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A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs
Wu, Qian; Bayerl, A.; Porti, Marc; Martin-Martinez, Javier; Lanza, Mario; Rodiguez, Rosanna; Velayudhan, Vikas; Nafria, Montserrat; Aymerich, Xavier; Gonzalez, Mireia B; Simoen, Eddy (2014) -
Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach
Wu, Qian; Porti, Marc; Bayerl, Albin; Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, Xavier; Simoen, Eddy (2015) -
Influence of vacuum environment on conductive atomic force microscopy measurements of advanced metal-oxide-semiconductor gate dielectrics
Aguilera, Lidia; Polspoel, Wouter; Volodin, Alexander; Van Haesendonck, Chris; Porti, Marc; Vandervorst, Wilfried; Nafria, Montserrat; Aymerich, Xavier (2008) -
Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors
Polspoel, Wouter; Vandervorst, Wilfried; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier (2008) -
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors
Bayerl, Albin; Lanza, Mario; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier; De Gendt, Stefan (2013) -
Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions
Saraza-Canflanca, Pablo; Rodriguez, Rosana; Martin-Martinez, Javier; Castro-Lopez, Rafael; Roca, Elisenda; V. Fernandez, Fancisco; Nafria, Montserrat; Diaz Fortuny, Javier (2021)