Browsing Articles by imec author "4f7c405e2130e203d3178660ae69b5e0824c1d83"
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A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
Kaczer, Ben; Franco, Jacopo; Weckx, Pieter; Roussel, Philippe; Putcha, Vamsi; Bury, Erik; Simicic, Marko; Vaisman Chasin, Adrian; Linten, Dimitri; Parvais, Bertrand; Catthoor, Francky; Rzepa, Gerhard; Waltl, Michael; Grasser, Tibor (2018) -
Amorphous indium-gallium-zinc-oxide as electron transport layer in organic photodetectors
Arora, Himani; Malinowski, Pawel; Vaisman Chasin, Adrian; Cheyns, David; Steudel, Soeren; Schols, Sarah; Heremans, Paul (2015) -
An integrated a-IGZO UHF energy harvester for passive RFID tags
Vaisman Chasin, Adrian; Volskiy, Vladimir; Libois, Michael; Myny, Kris; Nag, Manoj; Rockele, Maarten; Vandenbosch, Guy; Genoe, Jan; Gielen, Georges; Heremans, Paul (2014) -
Analysis of frequency dispersion in amorphous In-Ga-Zn-O thin film transistors
Bhoolokam, Ajay; Nag, Manoj; Vaisman Chasin, Adrian; Steudel, Soeren; Genoe, Jan; Gelinck, Gerwin; Groeseneken, Guido; Heremans, Paul (2015) -
Analysis of the features of hot-carrier degradation in FinFETs
Makarov, Alexander; Tyaginov, Stanislav; Kaczer, Ben; Jech, Markus; Vaisman Chasin, Adrian; Grill, Alexander; Hellings, Geert; Vexler, Mikhail; Linten, Dimitri; Grasser, Tibor (2018-10) -
Back-channel-etch amorphous indium-gallium-zinc oxide thin-film transistors: The impact of source/drain metal etch and final passivation
Nag, Manoj; Bhoolokam, Ajay; Steudel, Soeren; Myny, Kris; Maas, Joris; Vaisman Chasin, Adrian; Groeseneken, Guido; Heremans, Paul (2014) -
Bi-modal variability of nFinFET characteristics during hot-carrier stress: a modeling approach
Makarov, Alexander; Kaczer, Ben; Vaisman Chasin, Adrian; Vandemaele, Michiel; Grill, Alexander; Hellings, Geert; El-Sayed, Al-Moatasem; Grasser, Tibor; Linten, Dimitri; Tyaginov, Stanislav (2019) -
Bidirectional communication in an HF hybrid organic/solution-processed metal-oxide RFID tag
Myny, Kris; Rockele, Maarten; Vaisman Chasin, Adrian; Pham, Duy-Vu; Steiger, Jürgen; Botnaras, Silviu; Weber, Dennis; Herold, Bernhard; Ficker, Jürgen; van der Putten, Bas; Gelinck, Gerwin; Genoe, Jan; Dehaene, Wim; Heremans, Paul (2014) -
Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range
Tyaginov, Stanislav; Bury, Erik; Grill, Alexander; Yu, Zhuoqing; Makarov, Alexander; De Keersgieter, An; Vexler, Mikhail; Vandemaele, Michiel; Wang, Runsheng; Spessot, Alessio; Vaisman Chasin, Adrian; Kaczer, Ben (2023) -
Comparative study of source-drain contact metals for amorphous InGaZnO thin-film transistors
Nag, Manoj; Bhoolokam, Ajay; Steudel, Soeren; Vaisman Chasin, Adrian; Groeseneken, Guido; Heremans, Paul (2014) -
Complex amorphous oxides: property prediction from high throughput DFT and AI for new material search
van Setten, Michiel; Dekkers, Harold; Pashartis, Christopher; Vaisman Chasin, Adrian; Belmonte, Attilio; Delhougne, Romain; Kar, Gouri Sankar; Pourtois, Geoffrey (2022) -
Cyclic Thermal Effects on Devices of Two-Dimensional Layered Semiconducting Materials
Kim, Yeonsu; Kaczer, Ben; Verreck, Devin; Grill, Alexander; Kim, Doyoon; Song, Jaeick; Diaz Fortuny, Javier; Vici, Andrea; Park, Jongseon; Van Beek, Simon; Simicic, Marko; Bury, Erik; Vaisman Chasin, Adrian; Linten, Dimitri; Lee, Jaewoo; Chun, Jungu; Kim, Seongji; Seo, Beumgeun; Choi, Junhee; Shim, Joon Hyung; Lee, Kookjin; Kim, Gyu-Tae (2021) -
Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications
Lee, Kookjin; Ji, Hyunjin; Kim, Yanghee; Kaczer, Ben; Lee, Hyebin; Ahn, Jae-Pyoung; Choi, Junhee; Grill, Alexander; Panarella, Luca; Smets, Quentin; Verreck, Devin; Van Beek, Simon; Vaisman Chasin, Adrian; Linten, Dimitri; Na, Junhong; Lee, Jae Woo; De Wolf, Ingrid; Kim, Gyu-Tae (2022) -
Deep-level transient spectroscopy on an amorphous InGaZnO4 Schottky diode
Vaisman Chasin, Adrian; Simoen, Eddy; Nag, Manoj; Bhoolokam, Ajay; Genoe, Jan; Gielen, Georges; Heremans, Paul (2014) -
Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI
Rinaudo, Pietro; Vaisman Chasin, Adrian; Franco, Jacopo; Wu, Zhicheng; Subhechha, Subhali; Arutchelvan, Goutham; Eneman, Geert; Yengula Venkata Ramana, Bhuvaneshwari; Rassoul, Nouredine; Delhougne, Romain; Kaczer, Ben; De Wolf, Ingrid; Kar, Gouri Sankar (2023) -
Deposition, Characterization, and Performance of Spinel InGaZnO4
Dekkers, Harold; van Setten, Michiel; Belmonte, Attilio; Vaisman Chasin, Adrian; Subhechha, Subhali; Rassoul, Nouredine; Glushkova, Anastasia; Delhougne, Romain; Kar, Gouri Sankar (2022-02-23) -
Flexible NAND-like organic ferroelectric memory array
Kam, Benjamin; Ke, Tung Huei; Vaisman Chasin, Adrian; Tyagi, Manav; Cristoferi, Claudio; Tempelaars, Karin; Van Breemen, Albert; Myny, Kris; Schols, Sarah; Genoe, Jan; Gelinck, Gerwin; Heremans, Paul (2014) -
Gigahertz operation of a-IGZO Schottky diodes
Vaisman Chasin, Adrian; Nag, Manoj; Bhoolokam, Ajay; Myny, Kris; Steudel, Soeren; Schols, Sarah; Genoe, Jan; Gielen, Georges; Heremans, Paul (2013) -
High performance a-IGZO thin film diode as selector for cross-point memory application
Vaisman Chasin, Adrian; Zhang, Leqi; Bhoolokam, Ajay; Nag, Manoj; Steudel, Soeren; Govoreanu, Bogdan; Gielen, Georges; Heremans, Paul (2014) -
High performance a-IGZO thin-film-transistors with mf-PVD SiO2 as an etch-stop-layer
Nag, Manoj; Steudel, Soeren; Bhoolokam, Ajay; Vaisman Chasin, Adrian; Rockele, Maarten; Myny, Kris; Maas, Joris; Fritz, Thomas; Trube, Jutta; Groeseneken, Guido; Heremans, Paul (2014)