Browsing Presentations by imec author "455ff25f3b8a51e6f54b3a705075b5dd77d91300"
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A 90nm RF CMOS technology supported by device modelling and circuit demonstrators
Ramos, Javier; Mercha, Abdelkarim; Jeamsaksiri, Wutthinan; Linten, Dimitri; Jenei, Snezana; Thijs, Steven; Scholten, Andries; Wambacq, Piet; Debusschere, Ingrid; Decoutere, Stefaan (2004) -
An insight into the effects induced by heavy-ion strikes in
Griffoni, Alessio; Thijs, Steven; Chen, Shih-Hung; Tazzoli, Augusto; Cordoni, Martina; Colombo, Paolo; Paccagnella, Alessandro; Linten, Dimitri; Groeseneken, Guido (2011) -
An integrated measurement set-up to study the impact of atmosphere on ESD in MEMS
Sangameswaran, Sandeep; De Coster, Jeroen; Cherman, Vladimir; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; De Wolf, Ingrid; Groeseneken, Guido (2010) -
ESD characterization – standards, challenges and trends (Tutorial)
Scholz, Mirko; Thijs, Steven; Linten, Dimitri (2009) -
ESD evaluation of 3D SIC technology using TSV
Thijs, Steven; Linten, Dimitri; Scholz, Mirko; Mercha, Abdelkarim; Van der Plas, Geert; Travaly, Youssef; Van Olmen, Jan; Groeseneken, Guido (2010) -
ESD issues in MEMS: a case study in micromirrors
Sangameswaran, Sandeep; De Coster, Jeroen; Linten, Dimitri; Scholz, Mirko; Thijs, Steven; Haspeslagh, Luc; Witvrouw, Ann; Van Hoof, Chris; Groeseneken, Guido; De Wolf, Ingrid (2008) -
ESD protection challenges in RFCMOS circuits - an overview
Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Thijs, Steven; Groeseneken, Guido (2004) -
ESD protection for wideband RFCMOS circuits – challenges, options, and trade-offs
Linten, Dimitri; Thijs, Steven; Natarajan, Mahadeva (2007) -
ESD protection in FinFET technologies
Thijs, Steven (2011) -
ESD reliability issues in sub-micron CMOS - trends and challenges
Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Thijs, Steven; De Heyn, Vincent; Daenen, Tom; Groeseneken, Guido (2003) -
ESD-aspects of FinFETs and other most advanced devices
Russ, Christian; Gossner, Harald; Thijs, Steven; Griffoni, Alessio (2010) -
ESD-protection of advanced RF and broadband integrated circuits and MEMS
Linten, Dimitri; Thijs, Steven; Sangameswaran, Sandeep (2010) -
Impact of CMOS Scaling and Technology Options on ESD Reliability
Mahadeva Iyer, Natarajan; Thijs, Steven; Vassilev, Vesselin; Tremouilles, David; Linten, Dimitri; Groeseneken, Guido (2005) -
Improved calibration method for VFTLP transients
Thijs, Steven; Linten, Dimitri; Sawada, Masanori; Groeseneken, Guido (2011) -
Multispectral time delay integration CCD-in-CMOS image sensor for high resolution earth observation
Mahato, Swaraj; Thijs, Steven; Boulenc, Pierre; Bentell, Jonas; Wu, Linkun; De Moor, Piet (2019) -
Reduced solder joint lifetime due to introduction of low- CTE (green) mould compounds
Vandevelde, Bart; Thijs, Steven; Willems, Geert (2013) -
RF CMOS modelling for circuit design
Ramos, Javier; Mercha, Abdelkarim; Jeamsaksiri, Wutthinan; Linten, Dimitri; Jenei, Snezana; Thijs, Steven; Scholten, Andries; Wambacq, Piet; Debusschere, Ingrid; Decoutere, Stefaan (2004) -
Self-protection capability of integrated power arrays
Vashchenko, Vladislav; Scholz, Mirko; Linten, Dimitri; Lafonteese, David; Thijs, Steven; Jansen, Philippe; Hopper, Peter; Groeseneken, Guido (2010) -
System to component level correlation factor
Thijs, Steven; Scholz, Mirko; Linten, Dimitri; Russ, Christian; Stadler, Wolfgang; Sawada, Masanori; Groeseneken, Guido (2010) -
Transient characterization of high voltage switching devices
Scholz, Mirko; Linten, Dimitri; Thijs, Steven; Sawada, Masanori; Vashchenko, V.; Vandersteen, Gerd; Groeseneken, Guido (2010)