Browsing Presentations by author "Iacopi, Francesca"
Now showing items 1-11 of 11
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A study of plasma-enhanced CVD growth of Si nanowires catalyzed by indium
Iacopi, Francesca; Vereecken, Philippe; Schaekers, Marc; Caymax, Matty; Detavernier, Christophe; Griffiths, Hefin (2007) -
Buckling instabilities of thin cap layers deposited onto low-k dielectric films
Iacopi, Francesca; Brongersma, Sywert; Maex, Karen; Abell, Thomas (2002) -
Characteristics of indium-nanoparticle-catalyzed Si nanowires
Wang, Zhiwei; Li, Ziyou; Palmer, R.E.; Iacopi, Francesca (2008) -
Continued scalability of copper/low-k interconnects
Brongersma, Sywert; Carbonell, Laure; Vanstreels, Kris; Iacopi, Francesca; D'Haen, Jan; Zhang, Wenqi; Travaly, Youssef; Demuynck, Steven; Tokei, Zsolt; De Ceuninck, Ward; Maex, Karen (2005) -
Effects of UV-cure on mechanical, physical and electrical properties of microporous SiOC:H dielectric films
Iacopi, Francesca; Waldfried, Carlo; Abell, Thomas; Guyer, Eric; Eyckens, Brenda; Travaly, Youssef; Sajavaara, Timo; Gage, David M.; Beyer, Gerald; Berry, Ivan; Dauskardt, Reinhold; Maex, Karen (2005) -
Influence of pH on the channel cracking rate of organosilicate films in wet ambients
Iacopi, Francesca; Elia, Carmine; Fournier, Teddy; Sinapi, Fabrice; Heylen, Nancy; Travaly, Youssef (2007) -
Influence of UV-cure on low-k properties
Iacopi, Francesca (2005) -
Integration of semiconductor nanowires in silicon CMOS technology: compatibility study
Vereecken, Philippe; Björk, Michael; Brongersma, Sywert; Iacopi, Francesca; Riel, Heike; Riess, Walter; Van den Bosch, Geert; Vijayraghavan, Raghavan (2007) -
Si nanowire growth with non-Au catalysts by plasma enhanced chemical vapour deposition
Iacopi, Francesca; Vereecken, Philippe; Moelans, Nele; Blanpain, Bart; Detavernier, Christophe; Griffiths, Hefin (2007) -
UV-assisted curing: an effective technique for toughening of low-k organosilicate films
Iacopi, Francesca; Waldfried, Carlo; Houthoofd, Kristof; Guyer, Eric; Gage, David; Carlotti, Giovanni; Travaly, Youssef; Abell, Thomas; Escorcia, Orlando; Beyer, Gerald; Berry, Ivan; Dauskardt, Reinhold; Maex, Karen (2005) -
Wafer level detection of sealing defects
Le, Quoc Toan; Holsteyns, Frank; Iacopi, Francesca; Maex, Karen (2003)