Browsing Presentations by imec author "79920afeac5200d9b4ae78a80d9eaaa2f561e9ef"
Now showing items 1-8 of 8
-
A TDI test imager in embedded CCD in CMOS technology
Ercan, Alper; Robbelein, Jo; De Munck, Koen; Minoglou, Kiki; Lauwers, Anne; Haspeslagh, Luc; De Moor, Piet (2013) -
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility Transistors
Eneman, Geert; Simoen, Eddy; Delhougne, Romain; Gaubas, Eugenijus; Simons, Veerle; Roussel, Philippe; Verheyen, Peter; Lauwers, Anne; Loo, Roger; Vandervorst, Wilfried; De Meyer, Kristin; Claeys, Cor (2004) -
First electrical demonstration of DRAM compatible Ni silicides
Machkaoutsan, Vladimir; Bauer, Matthias; Zhang, Y.; Koelling, Sebastian; Franquet, Alexis; Vanormelingen, Koen; Verheyen, Peter; Loo, Roger; Kim, Chul Sung; Lauwers, Anne; Hoffmann, Thomas Y.; Absil, Philippe; Granneman, Ernst; Vandervorst, Wilfried; Thomas, Shawn. G (2009) -
Integration of SPER and FUSI in a pFET
Severi, Simone; Pawlak, Bartek; Veloso, Anabela; Duffy, Ray; Kottantharayil, Anil; Lauwers, Anne; Henson, Kirklen; de Marneffe, Jean-Francois; Eyben, Pierre; Vandervorst, Wilfried; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2004) -
New carbon-based thermal stability improvement technique for NiPtSi used in CMOS technology
Ortolland, Claude; Togo, Mitsuhiro; Rosseel, Erik; Mertens, Sofie; Kittl, Jorge; Lauwers, Anne; Hoffmann, Thomas Y. (2010) -
Ni-germanide contacts on Ge: phase formation and electrical characterization
Opsomer, Karl; Simoen, Eddy; Detavernier, C.; Lauwers, Anne; Lavoie, C.; Van Meirhaeghe, R.L.; Maex, Karen (2007) -
Photo diode detector with improved series resistance and optimised optical response
Havaldar, Dnyanesh; Lauwers, Anne; Kerner, Christoph; Merry, Billy; Haspeslagh, Luc (2014) -
Stress build-up during the Ni-silicidation in and around narrow silicide lines
Steegen, An; Lauwers, Anne; Chamirian, Oxana; Bender, Hugo; De Wolf, Ingrid; de Potter de ten Broeck, Muriel; De Tavernier, C.; Maex, Karen (2000)