Browsing Presentations by imec author "df53e5be73131672fcd12d5f4c5d10ef07ccc479"
Now showing items 1-20 of 41
-
Apport du rayonnement synchrotron à l'analyse de réseaux de condensateurs ferroélectriques integers
Menou, N.; Muller, Ch.; Goux, Ludovic; Wouters, Dirk; Barrett, R.; Save, D. (2004) -
Atomic disorder - intrinsic source of variability in RRAM materials
Clima, Sergiu; Degraeve, Robin; Fantini, Andrea; Goux, Ludovic; Govoreanu, Bogdan; Jurczak, Gosia; Pourtois, Geoffrey (2016) -
Cu alloys for conductive bridging memories as studied by C-AFM
Celano, Umberto; Goux, Ludovic; Opsomer, Karl; Conard, Thierry; Franquet, Alexis; Jurczak, Gosia; Vandervorst, Wilfried (2012) -
CuTCNQ-based non-volatile organic memories
Heremans, Paul; Muller, Robert; Billen, Joris; Katzenmeyer, Aaron; Genoe, Jan; Goux, Ludovic; Wouters, Dirk (2007) -
Electronic properties and conduction defects from first principles in doped GexSe1-x materials for selector applications
Clima, Sergiu; Opsomer, Karl; Devulder, Wouter; Goux, Ludovic; Afanasiev, Valeri; Kar, Gouri Sankar; Pourtois, Geoffrey (2018) -
Enhanced polarization of vanadium co-substituted BLT ((Bi, La)4Ti3012)thin films prepared by aqueous chemical solution deposition
Hardy, An; Vanhoyland, Geert; Van den Rul, Heidi; Van Bael, Marlies; Mullens, J.; Van Poucke, L.C.; D'Haen, Jan; Wouters, Dirk; Goux, Ludovic (2005) -
Evaluation of switching properties of CuTCNQ-based non-volatile memory at nanometer scale by conductive-AFM
Thomas, Maryline; Deleruyelle, Damien; Kever, Thorsten; Muller, Robert; Demolliens, Antoine; Turquat, Christian; Goux, Ludovic; Boettger, Ulrich; Wouters, Dirk; Waser, Rainer; Muller, Christophe (2009) -
Excellent reliability properties of 0.81mm2 integrated SBT fecap's with 3-D structure
Goux, Ludovic; Russo, G.; Lisoni, Judit; Schwitters, Michael; Paraschiv, Vasile; Maes, David; Haspeslagh, Luc; Wouters, Dirk; Zambrano, R. (2005) -
Excellent Roff/Ron ratio and short programming time in Cu/Al2O3-based conductive-bridge RAM under low-current (10μA) operation
Belmonte, Attilio; Fantini, Andrea; Degraeve, Robin; Redolfi, Augusto; Houssa, Michel; Jurczak, Gosia; Goux, Ludovic (2015) -
Ferroelectric properties and reliability of sidewall SBT in integrated 3D FeCAPs
Goux, Ludovic; Menou, N.; Lisoni, Judit; Schwitters, M.; Paraschiv, Vasile; Maes, David; Zhen, X.; Kaczer, Ben; Haspeslagh, Luc; Wouters, Dirk; Muller, C.; Caputa, C.; Zambrano, R. (2004) -
First principles simulations of oxygen diffusion in RRAM materials
Clima, Sergiu; Sankaran, Kiroubanand; Mees, Maarten; Chen, Yangyin; Goux, Ludovic; Govoreanu, Bogdan; Wouters, Dirk; Kittl, Jorge; Jurczak, Gosia; Pourtois, Geoffrey (2012) -
First-principles modeling of OTS chalcogenides for SELECTORS
Clima, Sergiu; Garbin, Daniele; Devulder, Wouter; Keukelier, Jonas; Opsomer, Karl; Goux, Ludovic; Kar, Gouri Sankar; Pourtois, Geoffrey (2019) -
IMEC's emerging memory technology research roadmap
Badaroglu, Mustafa; Collaert, Nadine; Goux, Ludovic; Debucquoy, Maarten; Kam, Benjamin; Miranda Corbalan, Miguel (2010) -
Influence of metal and SBT dry-etch on FeCAP properties and role of recovery anneals
Goux, Ludovic; Paraschiv, Vasile; Boullart, Werner; Lisoni, Judit; Schwitters, M.; Maes, David; Haspeslagh, Luc; Wouters, Dirk; Caputa, Concetta; Casella, P.; Zambrano, R.; Vecchio, G.; Monchoix, H. (2004) -
Influence of the chalcogen element on the filament stability in CuIn(Te,Se,S)2/Al2O3 filamentary switching devices
Ahmad, Tareq; Devulder, Wouter; Opsomer, Karl; Minjauw, Matthias; Celano, Umberto; Hantschel, Thomas; Vandervorst, Wilfried; Goux, Ludovic; Kar, Gouri Sankar; Detavernier, Christophe (2018) -
Influence of top electrode deposition conditions on the reliability of integrated SBT ferroelectric capacitors
Goux, Ludovic; Xu, Zhen; Paraschiv, Vasile; Schwitters, M.; Lisoni, Judit; Maes, David; Haspeslagh, Luc; Groeseneken, Guido; Zambrano, R.; Wouters, Dirk (2004) -
Instability of conductive filaments in conductive brigding memory devices
Celano, Umberto; Goux, Ludovic; Opsomer, Karl; Belmonte, Attilio; Jurczak, Gosia; Vandervorst, Wilfried (2013) -
Integration of ferroelectric SrBi2Ta2O9-based capacitors beyond 0.18 CMOS technology
Johnson, J.; Goux, Ludovic; Schwitters, Michael; Paraschiv, Vasile; Maes, David; Haspeslagh, Luc; Wouters, Dirk; Caputa, Concetta; Casella, C.; Zambrano, R.; Vecchio, Emma; Monchoix, Hervé; Van Autryve, Luc; Lisoni, Judit (2003) -
Integration of MOCVD SBT stacked ferroelectric capacitors in A 0.35um CMOS technology
Maes, David; Everaert, Jean-Luc; Goux, Ludovic; Lisoni, Judit; Paraschiv, Vasile; Schuster, Thomas; Haspeslagh, Luc; Wouters, Dirk; Artoni, C.; Caputa, Concetta; Casella, P.; Corallo, G.; Russo, G.; Zambrano, R.; Monchoix, H.; Van Autryve, Luc (2004)