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Browsing by Author "Arstila, Kai"

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    An optical force measurement system with microfabricated mirror probes and in-plane tips for semiconductor device characterization

    Hantschel, Thomas  
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    Arstila, Kai
    Meeting abstract
    2010, 2nd Kleindiek User Meeting, 14/03/2010
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    Analysis of nanoparticles with elastic recoil detection

    Arstila, Kai
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    Brijs, Bert
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    Giangrandi, Simone
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    Hantschel, Thomas  
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    Vandervorst, Wilfried  
    Proceedings paper
    2009, 19th Ion Beam Analysis Conference - IBA, 7/09/2009
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    ARIBA: a combined analysis set-up for high resolution RBS and TOF-ERDA for thin film analysis

    Sajavaara, Timo
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    Brijs, Bert
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    Giangrandi, Simone
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    Arstila, Kai
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    Vantomme, Andre  
    Oral presentation
    2004, 8th European Conference on Accelerators in Applied Research and Technology
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    Automated control of the nanoprober system for nanoscale electrical measurements

    Arstila, Kai
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    Hantschel, Thomas  
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    Nuytten, Thomas  
    Oral presentation
    2013, Kleindiek User Meeting
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    Carbon nanotube growth for through-silicon via applications

    Xie, Rongsie
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    Zhang, Can
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    van der Veen, Marleen  
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    Arstila, Kai
    ;
    Hantschel, Thomas  
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    Chen, Bingan
    Journal article
    2013, Nanotechnology, (24) 12, p.125603
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    Composition quantification of microelectronics multilayer thin films by EDX: toward small scale analysis

    Conard, Thierry  
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    Arstila, Kai
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    Hantschel, Thomas  
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    Franquet, Alexis  
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    Vandervorst, Wilfried  
    Proceedings paper
    2009, Electron Crystallography for Materials Research and Quantitative Characterization of Nanostructured Materials, 13/04/2009, p.HH08-08
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    Compressively strained SiGe band-to-band tunneling model calibration based on p-i-n diodes and prospects of strained SiGe tunneling field-effect transistors

    Kao, Frank  
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    Verhulst, Anne  
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    Rooyackers, Rita
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    Douhard, Bastien  
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    Delmotte, Joris
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    Bender, Hugo  
    Journal article
    2014, Journal of Applied Physics, (116) 21, p.214506
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    Considerations about multiple and plural scattering in heavy-ion low-energy ERDA

    Giangrandi, Simone
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    Arstila, Kai
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    Brijs, Bert
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    Sajavaara, T.
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    Vantomme, Andre  
    Journal article
    2009, Nuclear Instruments and Methods in Physics Research B, (267) 11, p.1936-1941
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    Depth resolution optimization and role of multiple scattering in low-energy TOF-ERDA

    Giangrandi, Simone
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    Brijs, Bert
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    Arstila, Kai
    ;
    Sajavaara, T.
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    Vantomme, Andre  
    Oral presentation
    2007, International Workshop on High-Resolution Depth Profiling
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    Depth resolution optimization for low-energy ERDA

    Giangrandi, Simone
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    Arstila, Kai
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    Brijs, Bert
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    Sajavaara, T.
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    Vantomme, Andre  
    Journal article
    2007, Nuclear Instruments and Methods in Physics Research B, (261) 1_2, p.512-515
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    Detection of failure sites by focused ion beam and nano-probing in the interconnect of three-dimensional stacked circuit structures

    Yang, Yu
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    Bender, Hugo  
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    Arstila, Kai
    ;
    Swinnen, Bart  
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    Verlinden, Bert
    ;
    De Wolf, Ingrid  
    Journal article
    2008, Microelectronics Reliability, (48) 8_9, p.1517-1520
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    Development of methodologies for characterizing individual carbon nanotubes and silicon nanowires for use in nanoelectronics technology

    Hantschel, Thomas  
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    Cott, Daire  
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    Palanne, Saku
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    Richard, Olivier  
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    Arstila, Kai
    ;
    Verhulst, Anne  
    Oral presentation
    2008, 4th International Conference on Nanotechnology
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    Diamond nano-particle seeding for tip moulding application

    Tsigkourakos, Menelaos
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    Hantschel, Thomas  
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    Arstila, Kai
    ;
    Vandervorst, Wilfried  
    Journal article
    2013, Diamond and Related Materials, (35) 1, p.14-18
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    Diamond nano-particle seeding on three-dimensional geometries for tip moulding application

    Tsigkourakos, Menelaos
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    Hantschel, Thomas  
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    Arstila, Kai
    ;
    Vandervorst, Wilfried  
    Meeting abstract
    2012, 23rd International Conference on Diamond and Carbon Materials, 3/09/2012, p.P2.85
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    Diamond tip based automated two-point electrical probing on the nanoscale

    Hantschel, Thomas  
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    Arstila, Kai
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    Olanterae, Lauri
    ;
    Vandervorst, Wilfried  
    Oral presentation
    2010, Diamond 2010: 21st European Conference on Diamond, Diamond- Like Materials, Carbon Nanotubes, and Nitrides
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    Diamond tips for automated electrical probing inside a scanning electron microscopy system

    Hantschel, Thomas  
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    Arstila, Kai
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    Olantera, Lauri
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    Schulze, Andreas
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    Werner, Thilo
    ;
    Eyben, Pierre  
    Journal article
    2011, Diamond and Related Materials, (20) 5_6, p.655-659
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    Diamond tips for electrical probing on the nanometer scale

    Hantschel, Thomas  
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    Arstila, Kai
    ;
    Schulze, Andreas
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    Eyben, Pierre  
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    Tsigkourakos, Menelaos
    Oral presentation
    2011, 22nd European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, and Nitrides - Diamond
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    Effect of boron doping on the wear behavior of the growth and nucleation surfaces of micro- and nanocrystalline diamond films

    Buijnsters, Josephus G.
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    Tsigkourakos, Menelaos
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    Hantschel, Thomas  
    ;
    Gomes, Oliver
    Journal article
    2016, ACS Applied Materials & Interfaces, (8) 39, p.26381-26391
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    Effects of interfacial strength and dimension of structures on physical cleaning window

    Kim, Tae-Gon
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    Pacco, Antoine  
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    Wostyn, Kurt  
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    Xu, XiuMei  
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    Struyf, Herbert  
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    Arstila, Kai
    ;
    Park, Jin-Goo
    Meeting abstract
    2010, 10th International Symposium on Ultra-Clean Processing of Semiconductor Devices - UCPSS, 19/10/2010, p.10-11
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    Electrical resistivity and contact resistance in carbon nanotube vertical interconnects

    Chiodarelli, Nicolo
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    Li, Yunlong  
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    Arstila, Kai
    ;
    Richard, Olivier  
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    Cott, Daire  
    ;
    Heyns, Marc  
    Meeting abstract
    2010, MRS Fall meeting Symposium B: Carbon-Based Electronic Devices--Processing, Performance, and Reliability, 29/11/2010, p.B1.10
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