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Browsing by Author "Baelmans, M."

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    Analytical thermo-mechanical model for non-underfilled area array flip chip assemblies

    Vandevelde, Bart  
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    Beyne, Eric  
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    Vandepitte, D.
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    Baelmans, M.
    Journal article
    2004-09, Journal of Electronic Packaging, (126) 3, p.351-358
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    Demonstration of Package Level 3D-printed Direct Jet Impingement Cooling applied to High power, Large Die Applications

    Wei, Tiwei  
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    Oprins, Herman  
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    Cherman, Vladimir  
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    Yang, Z.
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    Rivera, K.
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    Van der Plas, Geert  
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.1422-1429
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    Influence of printed circuit board properties on solder joint fatigue life of assembled IC packages

    Vandevelde, Bart  
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    Gonzalez, Mario  
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    Beyne, Eric  
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    Vandepitte, D.
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    Baelmans, M.
    Proceedings paper
    2004, Proceedings European Microelectronics Packaging Symposium (IMAPS Europe), 16/06/2004, p.65-70
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    Modified micro-macro thermo-mechanical modelling of ceramic ball grid array packages

    Vandevelde, Bart  
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    Degryse, Dominiek
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    Beyne, Eric  
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    Roose, E.
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    Corlatan, D.
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    Swaelen, G.
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    Willems, G.
    Journal article
    2003, Microelectronics Reliability, (43) 2, p.307-318
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    Parameter study for the reliability of underfilled flip chip and CSP assemblies

    Vandevelde, Bart  
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    Degryse, Dominiek
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    Beyne, Eric  
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    Vandepitte, D.
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    Baelmans, M.
    Proceedings paper
    2002, Proceedings of the European Microelectronics Packaging and Interconnection Symposium - IMAPS-EUROPE, 14/06/2002, p.130-135
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    Parameterised modelling of thermo-mechanical reliability for CSP assemblies

    Vandevelde, Bart  
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    Beyne, Eric  
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    Zhang, K.G.Q.
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    Caers, J.
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    Vandepitte, D.
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    Baelmans, M.
    Journal article
    2003, ASME Journal of Electronic Packaging, (125) 4, p.498-805
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    Semi-analytical model for calculation of induced strains in solder joints of underfilled flip chip assemblies

    Vandevelde, Bart  
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    Beyne, Eric  
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    Vandepitte, D.
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    Baelmans, M.
    Journal article
    2002, International Journal of Microcircuits and Electronic Packaging, (25) 3, p.264-278
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    Semi-analytical model for calculation of induced strains in solder joints of underfilled flip chip assemblies

    Vandevelde, Bart  
    ;
    Beyne, Eric  
    ;
    Vandepitte, D.
    ;
    Baelmans, M.
    Proceedings paper
    2002, Proceedings of the 3rd Eurosime Conference, 14/04/2002, p.86-91

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