Browsing by Author "Bauer, M."
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Publication Assessing personal networks on a Pan-European testbed
; ; Publication Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
Publication Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain
Proceedings paper2010, International Conference on Solid-State and Integrated Circuit Technology, 1/11/2010Publication Electrical demonstration of thermally stable Ni silicides on Si1-xCx epitaxial layers
Journal article2010, Microelectronic Engineering, (87) 3, p.306-310Publication On the low-frequency noise performance of embedded Si:C nMOSFETs
Proceedings paper2009, ULSI Process Integration 6, 4/10/2009, p.193-200Publication On the low-frequency noise performance of embedded Si:C nMOSFETs
Meeting abstract2009, 216th ECS Meeting, 4/10/2009, p.2363Publication SiCP selective epitaxial growth in recessed source/drain regions yielding to drive current enhancement in n-channel MOSFET
; Meeting abstract2008, 214th ECS Meeting, 12/10/2008, p.2486Publication Strain relaxation of SiGe buffers on Si and SOI wafers induced by He+ ion implantation and thermal annealing
Publication Thermal stability of Pt and C-doped NiSi films
Proceedings paper2007, 15th IEEE Conference on Advanced Thermal Processing of Semiconductors - RTP, 2/10/2007, p.145-149