Browsing by Author "Baumgartner, O."
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Publication A comprehensive model for correlated drain and gate current fluctuations
Proceedings paper2013, 16th International Workshop on Computational Electronics - IWCE, 4/06/2013, p.46-47Publication A TCAD Compatible SONOS Trapping Layer Model for Accurate Programming Dynamics
Publication Direct tunneling and gate current fluctuations
; Kosina, H.Proceedings paper2013, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 3/09/2013, p.17-20Publication Monolithic TCAD simulation of phase-change memory (PCM/PRAM) plus Ovonic Threshold Switch (OTS) selector device
Publication Multiphonon processes as the origin of reliability issues
Proceedings paper2013, Semiconductors, Dielectrics, and Materials for Nanoelectronics II, 27/10/2013, p.31-47Publication Quantum-mechanical modeling of NBTI in High-k SiGe MOSFETs
Proceedings paper2011, International Conference on Simulation of Semiconductor Processes and Devices - SISPAD, 8/09/2011Publication Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies
Publication Understanding correlated drain and gate current fluctuations
; Grasser, T.Proceedings paper2013, 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA, 15/07/2013, p.51-56Publication Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling
Proceedings paper2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021