Browsing by Author "Bonaldo, Stefano"
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Publication TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses
Publication Total-ionizing-dose effects in InGaAs MOSFETs with high-k gate dielectrics and InP substrates
Journal article2020, IEEE Transactions on Nuclear Science, (67) 7, p.1312-1319Publication Total-ionizing-dose effects on InGaAs FinFETs with improved gate stack
Proceedings paper2019, Radiation Effects on Devices & ICs 2019 - RADECS, 16/09/2019Publication Total-ionizing-dose effects on InGaAs FinFETs with modified gate stack
Journal article2020-01, IEEE Transactions on Nuclear Science, (67) 1, p.253-259Publication Total-Ionizing-Dose Response of Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors