Browsing by Author "Chai, Zheng"

Cycling Induced Metastable Degradation in GeSe Ovonic Threshold Switching Selector

Evidence of filamentary switching and relaxation mechanisms in GexSe1-x OTS selectors

Identify the critical regions and switching/failure mechanisms in non-filamentary RRAM ( a-VMCO) by RTN and CVS techniques for memory window improvement

Impact of Relaxation on the Performance of GeSe True Random Number Generator Based on Ovonic Threshold Switching

Investigation of preexisting and generated defects in nonfilamentary a-Si/TiO2 RRAM and their impacts on RTN amplitude distribution

New Insights of the Switching Process in GeAsTe Ovonic Threshold Switching (OTS) Selectors

Probing the critical region of conductive filament in nanoscale hafnium-oxide resistive-switching device by random telegraph signals

Random telegraph signal noise in advanced high performance and memory devices

RTN-based defect tracking technique: experimentally probing the spatial and energy profile of the critical filament region and its correlation with HfO2 RRAM switching operation and failure mechanism

Stochastic computing based on volatile GeSe ovonic threshold switching selectors

TDDB Mechanism in a-Si/TiO2 Nonfilamentary RRAM Device

The over-reset phenomenon in Ta2O5 RRAM device investigated by the RTN-based defect probing technique