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Browsing by Author "Cotrin Teixeira, Ricardo"

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    3D Embedding and interconnection of ultra thin (<20um) silicon dies

    Iker, Francois
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    Sabuncuoglu Tezcan, Deniz  
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    Cotrin Teixeira, Ricardo
    ;
    Soussan, Philippe  
    Proceedings paper
    2007, 9th Electronics Packaging Technology Conference - EPTC, 10/12/2007, p.222-226
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    3D stacked IC demonstration using a through silicon via first approach

    Van Olmen, Jan  
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    Mercha, Abdelkarim  
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    Katti, Guruprasad
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    Huyghebaert, Cedric  
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    Van Aelst, Joke  
    Proceedings paper
    2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.603-606
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    Diamond bit cutting as alternative to polymer patterning for 3D interconnections technologies

    Iker, Francois
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    Funaya, Takuo
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    Cotrin Teixeira, Ricardo
    ;
    Ruythooren, Wouter  
    Proceedings paper
    2009, 59th Electronic Components and Technology Conference - ECTC, 26/05/2009, p.1284-1288
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    Diamond bit cutting for processing high topography wafers

    Agarwal, Rahul
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    Pham, Nga  
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    Cotrin Teixeira, Ricardo
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    Andrei, Alexandru  
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    Ruythooren, Wouter  
    Proceedings paper
    2009, 11th Electronics Packaging Technology Conference - EPTC, 9/12/1990
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    Die level thinning down to 15μm thickness

    Cotrin Teixeira, Ricardo
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    Torfs, Tom  
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    De Munck, Koen  
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    De Moor, Piet  
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    Baert, Kris
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    Van Hoof, Chris  
    Proceedings paper
    2007-12, Forum 2007 Be Flexible, 5/12/2007
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    High density 3D die stacking without through-Si-vias: ultra thin chip embedding as enabling technology

    Beyne, Eric  
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    Iker, Francois
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    Soussan, Philippe  
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    Funaya, Takuo
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    Vanfleteren, Jan  
    Proceedings paper
    2008, SEMICON Europe: Advanced Packaging Conference, 7/10/2008
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    Impact of thinning and packaging on a deep sub-micron CMOS product

    Perry, Dan
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    Ray, Urmi
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    Gu, Sam
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    Nakamoto, Mark
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    Sy, Wing
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    Wang, Kevin
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    Ruythooren, Wouter  
    ;
    Yang, Yu
    Oral presentation
    2009, Design, Automation & Test in Europe Conference -DATE : Workshop on 3D Integration (W5)
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    Process induced sub-surface damage in mechanically ground silicon wafers

    Yang, Yu
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    De Munck, Koen  
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    Cotrin Teixeira, Ricardo
    ;
    Swinnen, Bart  
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    Verlinden, Bert
    ;
    De Wolf, Ingrid  
    Journal article
    2008-07, Semiconductor Science and Technology, (23) 7, p.75038
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    Statistical analysis of the influence of thinning processes on the strength of silicon

    Yang, Yu
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    Cotrin Teixeira, Ricardo
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    Roussel, Philippe  
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    Swinnen, Bart  
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    Verlinden, Bert
    Proceedings paper
    2009, Materials Technology for 3-D Integration, 1/12/2008, p.1112-E03-09
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    Stress analysis on ultra thin ground wafers

    Cotrin Teixeira, Ricardo
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    De Munck, Koen  
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    De Moor, Piet  
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    Baert, Kris
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    Swinnen, Bart  
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    Van Hoof, Chris  
    Journal article
    2008, Journal of Integrated Circuits and Systems, (3) 2, p.83-89
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    Stress analysis on ultra thin ground wafers

    Cotrin Teixeira, Ricardo
    ;
    De Munck, Koen  
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    De Moor, Piet  
    ;
    Baert, Kris
    ;
    Swinnen, Bart  
    ;
    Van Hoof, Chris  
    Proceedings paper
    2007-09, Microelectronics Technology and Devices - SBMICRO, 3/09/2007, p.113-121
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    The influence of grinding and cleaning on Deep Reactive Ion Etching

    Verdonck, Patrick  
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    Van Cauwenberghe, Marc  
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    Phommahaxay, Alain  
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    Jamieson, Geraldine  
    Meeting abstract
    2009, 2nd International PESM Workshop on Plasma Etch and Strip in Microelectronics - PESM, 26/02/2009
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    Thickness characterization of ultra thin wafers on carrier

    Cotrin Teixeira, Ricardo
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    De Munck, Koen  
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    Baert, Kris
    ;
    Swinnen, Bart  
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    Knüttel, Alexsander
    Proceedings paper
    2007-12, 9th Electronics Packaging Technology Conference - EPTC, 10/12/2007, p.238-241
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    Wafer thinning and planarization tech-nology for 3D Interconnects

    Vaes, Jan
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    Cotrin Teixeira, Ricardo
    ;
    Swinnen, Bart  
    Proceedings paper
    2008, 13th International C.M.P. Planarization for ULSI Multilevel Interconnection Conference - CMP-MIC, 3/03/2008

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