Browsing by Author "Czerwinski, A."
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Publication Accurate extraction of the diffusion line current in silicon p-n junction diodes
Journal article1998, Applied Physics Letters, (72) 9, p.1054-1056Publication Activation energy analysis as a tool for extraction and investigation of p-n junction leakage current components
Journal article2003, Journal of Applied Physics, (94) 2, p.1218-1221Publication Analysis of the diffusion currrent in cobalt silicided n+p junctions
Meeting abstract1998, Belgische Natuurkundige Vereniging / Société Belge de Physique: General Scientific Meeting, 19/05/1998, p.CM34Publication Diode analysis of silicon substrate quality
Proceedings paper1999, Analytical and Diagnostic Techniques for Semiconductor Materials, Devices and Processes, 16/09/1999, p.248-258Publication Diode assessment of material characteristics in internally gettered and non-gettered Czochralski silicon: problems, pitfalls and guidelines
Proceedings paper1998, 2nd International Conference on Materials for Microelectronics - ICMM, 14/09/1998, p.42-51Publication Electrical characterisation of shallow cobalt-silicided junctions
Proceedings paper2000, 3rd International Conference Materials for Microelectronics, 16/10/2000, p.7-10Publication Electrical characterization of shallow cobalt-silicided junctions
Journal article2001, Journal of Materials Science: Materials in Electronics, (12) 4_6, p.207-10Publication Electrical quality assessment of epitaxial wafers based on p-n junction diagnostics
Journal article1999, J. Electrochem. Soc., (146) 9, p.3429-3434Publication Extraction of accurate lifetime and doping profiles in Si p-n junction diodes
Meeting abstract1997, Belgische Natuurkundige Vereniging / Société Belge de Physique : General Scientific Meeting, 29/05/1997, p.CM35Publication Gated-diode study of corner and peripheral leakage current in high-energy neutron irradiated silicon p-n junctions
Journal article2003, IEEE Trans. Nuclear Science, (50) 2, p.278-287Publication Impact of fast neutron irradiation on the silicon p-n junction leakage and role of the diffusion reverse current
Oral presentation2001, Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,Publication Impact of fast-neutron irradiation on the silicon P-N junction leakage and role of the diffusion reverse current
Journal article2002, Nuclear Instruments & Methods in Physics Research B, (186) 1_4, p.166-170Publication Impact of the generation width on the lifetime extraction in Cz silicon p-n junctions
Proceedings paper1999, Defects in Silicon III, 02/05/1999, p.88-99Publication Improved extraction of Si substrate parameters from combined I-V and C-V measurements on P-N junction diodes
Proceedings paper1997, Proceedings of the 7th International Autumn Meeting : Gettering and Defect Engineering in Semiconductor Technology - GADEST '97, 5/10/1997, p.477-482Publication Improved extraction of the activation energy of the leakage current in silicon P-N junction diodes
Journal article2001, Applied Physics Letters, (78) 14, p.1997-1999Publication Local electric field in silicided shallow junctions
Journal article2004, Journal of the Electrochemical Society, (151) 9, p.G578-G582Publication Metoda dokladnego wyznaczania parametrow polprzewodnika w zastosowaniu do pomiarow czasu zycia nosnikow i koncentracji domieszek / A method of accurate semiconductor parameters determination used for carrier lifetime and dopant concentration measurements
Proceedings paper1997, VI Konferencja Naukowa Technologia Elektronowa - ELTE, 6/05/1997, p.442-445Publication New method for accurate determination of the electric-field enhancement in junctions - theoretical model and application to STI diodes with high fields
Proceedings paper2002, High Purity Silicon VII, 20/10/2002, p.278-289Publication Optimised diode analysis of electrical silicon substrate properties
Proceedings paper1997, Crystalline Defects and Contamination Control: Their Impact and Control in Device Manufacturing II, 31/08/1997, p.218-227Publication Optimised diode assessment of the surface and bulk generation/recombination properties of silicon substrates
Proceedings paper1998, Semiconductor Silicon 1998. Proceedings of the 8th International Symposium on Silicon Materials Science and Technology, 4/05/1998, p.1576-1592