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Browsing by Author "De Jaeger, Brice"

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    200 mm Germanium-on-insulator(GeOI) by smart cut technology and recent GeOI MOSFETs achievements

    Akatsu, T.
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    Deguet, C.
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    Sanchez, L.
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    Richtarch, C.
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    Allibert, F.
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    Letertre, F.
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    Mazure, C.
    Proceedings paper
    2005, Proceedings of the IEEE International SOI Conference, 3/10/2005, p.137-138
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    200 V GaN-on-SOI Smart Power Platform for Monolithic GaN Power ICs

    Cosnier, Thibault  
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    Syshchyk, Olga  
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    De Jaeger, Brice  
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    Geens, Karen  
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    Cingu, Deepthi  
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    Fabris, Elena  
    Proceedings paper
    2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021
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    A compact model based on the Lambert function for AlGaN/GaN Schottky barrier gated-edge termination

    Trojman, Lionel
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    Acurio, Eliana
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    De Jaeger, Brice  
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    Posthuma, Niels  
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    Decoutere, Stefaan  
    Journal article
    2023, SOLID-STATE ELECTRONICS, (210) December, p.Art. 108778
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    A low thermal budget pre metal dielectric stack using PECVD and HDP processing

    Schaekers, Marc  
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    De Jaeger, Brice  
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    Sleeckx, Erik  
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    Debusschere, Ingrid  
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    Van Hove, Marleen
    Oral presentation
    2001, 7th International Dielectrics & Conductors for ULSI Multilevel Interconnection Conference (DCMIC) and Exhibition
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    A step towards a better understanding of silicon passivated (100) Ge p-channel

    Pourtois, Geoffrey  
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    Houssa, Michel  
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    De Jaeger, Brice  
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    Leys, Frederik
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    Kaczer, Ben  
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    Martens, Koen  
    Proceedings paper
    2007, Advanced Gate Stack , Source/Drain and Channel Engineering for Si-Based CMOS 3, 6/05/2007, p.53-63
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    Advanced transistors for high frequency applications

    Parvais, Bertrand  
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    Peralagu, Uthayasankaran  
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    Alian, AliReza  
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    Vais, Abhitosh  
    Proceedings paper
    2020, 237th ECS Spring Meeting - Advanced CMOS-compatible Semiconductor Devices 19, 10/05/2020, p.27-38
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    AlGaN/GaN/AlGaN double heterostructures grown on 200 mm silicon(111) substrates with high electron mobility

    Cheng, Kai
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    Liang, Hu  
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    Van Hove, Marleen
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    Geens, Karen  
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    De Jaeger, Brice  
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    Srivastava, Puneet
    Journal article
    2012, Applied Physics Express, (5) 1, p.011002-1
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    An industry-ready 200 mm p-GaN E-mode GaN-on-Si power technology

    Posthuma, Niels  
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    You, Shuzhen  
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    Stoffels, Steve  
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    Wellekens, Dirk  
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    Liang, Hu  
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    Zhao, Ming  
    Proceedings paper
    2018, 30th International Symposium on Power Semiconductor Devices and ICs - ISPSD, 13/05/2018, p.284-287
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    Analysis of junction leakage in advanced germanium p+/n junctions

    Eneman, Geert  
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    Sicart i Casain, Oriol
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    Simoen, Eddy  
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    Brunco, David
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    De Jaeger, Brice  
    Proceedings paper
    2007, ESSDERC Proceedings, 11/09/2007, p.454-457
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    Analysis of the temperature dependence of trap-assisted tunneling in Ge pFET junctions

    Bargallo Gonzalez, Mireia
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    Eneman, Geert  
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    Wang, Gang
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    De Jaeger, Brice  
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    Simoen, Eddy  
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    Claeys, Cor
    Journal article
    2011, Journal of the Electrochemical Society, (158) 10, p.H955-H960
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    Analysis of the temperature dependence of trap-assisted-tunneling in Ge pFETs junctions

    Bargallo Gonzalez, Mireia
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    Eneman, Geert  
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    Wang, Gang
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    De Jaeger, Brice  
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    Simoen, Eddy  
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    Claeys, Cor
    Proceedings paper
    2011, China Semiconductor Technology International Conference - CSTIC, 13/03/2011, p.725-730
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    Applicability of charge pumping on Germanium MOSFETs

    Martens, Koen  
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    Kaczer, Ben  
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    Grasser, Tibor
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    De Jaeger, Brice  
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    Meuris, Marc  
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    Maes, Herman
    Journal article
    2008, IEEE Electron Device Letters, (29) 12, p.1364-1366
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    Atomic layer deposition as an enabling technology for fabrication of germanium MOS transistor

    Eneman, Geert  
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    Delabie, Annelies  
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    Van Elshocht, Sven  
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    De Jaeger, Brice  
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    Nicholas, Gareth
    Oral presentation
    2007, 7th International Conference Atomic Layer Deposition Conference - ALD
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    Au-free AlGaN/GaN power diode on 8 in Si substrate with gated edge termination

    Lenci, Silvia  
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    De Jaeger, Brice  
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    Carbonell, Laure
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    Hu, Jie
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    Mannaert, Geert  
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    Wellekens, Dirk  
    Journal article
    2013, IEEE Electron Device Letters, (34) 8, p.1035-1037
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    Au-free CMOS-compatible AlGaN/GaN HEMT processing on 200 mm Si substrates

    De Jaeger, Brice  
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    Van Hove, Marleen
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    Wellekens, Dirk  
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    Kang, Xuanwu
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    Liang, Hu  
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    Mannaert, Geert  
    Proceedings paper
    2012, 24th International Symposium on Power Semiconductor Devices & IC's - ISPSD, 3/06/2012, p.49-52
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    Au-free low temperature ohmic contacts for AlGaN/GaN power devices on 200 mm substrates

    Firrincieli, Andrea  
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    De Jaeger, Brice  
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    You, Shuzhen  
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    Wellekens, Dirk  
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    Van Hove, Marleen
    Proceedings paper
    2013-09, Solid State Devices and Materials Conference - SSDM, 24/09/2013, p.914-915
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    Au-free ohmic contacts for AlGaN/GaN power devices on 200 mm Si substrates

    Firrincieli, Andrea  
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    De Jaeger, Brice  
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    You, Shuzhen  
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    Wellekens, Dirk  
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    Van Hove, Marleen
    Journal article
    2014, Japanese Journal of Applied Physics, 53, p.04EF01
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    Challenges and opportunities in advanced Ge pMOSFETs

    Simoen, Eddy  
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    Mitard, Jerome  
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    Hellings, Geert  
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    Eneman, Geert  
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    De Jaeger, Brice  
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    Witters, Liesbeth  
    Journal article
    2012, Materials Science in Semiconductor Processing, (15) 6, p.588-600
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    Channel backscattering characteristics of high performance germanium pMOSFETs

    Dobbie, Andrew
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    De Jaeger, Brice  
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    Meuris, Marc  
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    Whall, T.E
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    Leadley, D.R
    Proceedings paper
    2008, 9th International Conference on ULtimate Integration on Silicon - ULIS, 12/03/2008, p.7-10
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    Characterization of voltage and frequency dependent parasitics observed in Si passivated germanium metal gate pMOSFETs

    Krom, Raymond
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    Mitard, Jerome  
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    Plourde, Chelsea
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    De Jaeger, Brice  
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    Meuris, Marc  
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    Heyns, Marc  
    Meeting abstract
    2008, 32nd Workshop on Compound Semiconductor Devices and Integrated Circuits - WOCSDICE, 18/05/2008
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