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Browsing by Author "De Preter, Inge"

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    10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process

    Derakhshandeh, Jaber  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
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    Inoue, Fumihiro  
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    De Preter, Inge  
    Proceedings paper
    2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622
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    3D integration challenges for fine pitch back side micro-bumping on ZoneBOND™ wafers

    Buisson, Thibault
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    De Preter, Inge  
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    Suhard, Samuel  
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    Vandersmissen, Kevin  
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    Jaenen, Patrick  
    Proceedings paper
    2012, 4th Electronics System Integration Technologies Conference - ESTC, 17/09/2012
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    3D stacking cobalt and nickel microbumps and kinetics of corresponding IMCs at low temperatures

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Nagano, Fuya  
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    Houshmand Sharifi, Shamin  
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    Hou, Lin  
    Proceedings paper
    2017, IEEE International Interconnect Technology Conference - IITC, 16/05/2017, p.1-3
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    3D stacking of Co and Ni based microbumps

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Hou, Lin  
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    Gerets, Carine  
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    Wang, Teng
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    Rebibis, Kenneth June  
    Proceedings paper
    2016, Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5
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    3D stacking using bump-less process for sub 10μm pitches

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Gerets, Carine  
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    Hou, Lin  
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    Heylen, Nancy  
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    Beyne, Eric  
    Proceedings paper
    2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133
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    A study on IMC morphology and integration flow for low temperature and high throughput TCB down to 10 mu m pitch microbumps

    Derakhshandeh, Jaber  
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    Gerets, Carine  
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    Inoue, Fumihiro  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
    Proceedings paper
    2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.1119-1124
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    Bismuth-based solder characterization for lower-temperature assembly of thermally-sensitive components in 3D interconnect applications

    Vakanas, George
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    Vandecasteele, Bjorn  
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    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Snyder, Brad
    Meeting abstract
    2014, 23rd Conference on Materials for Advanced Metallization - MAM, 2/03/2013
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    Co-Sn intermetallic compoundsfor potential integration in 3D interconnects

    Vakanas, George
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    O, Minho
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    Dimcic, Biljana
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    Vandecasteele, Bjorn  
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    Vanstreels, Kris  
    Meeting abstract
    2014, 23rd Conference on Materials for Advanced Metallization - MAM, 2/03/2014
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    Cobalt UBM for fine pitch microbump applications in 3DIC

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Vandersmissen, Kevin  
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    Dictus, Dries  
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    Di Piazza, Luca  
    Proceedings paper
    2015, IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM, 18/05/2015, p.221-224
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    Comparing SAM (Self-Assembled Monolayer) deposition methods to passivate copper microbumps for 3D stacking

    Houshmand Sharifi, Shamin  
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    Derakhshandeh, Jaber  
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    Armini, Silvia  
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    De Preter, Inge  
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    Bex, Pieter  
    Meeting abstract
    2017, Materials for Advanced Metallization Conference - MAM, 26/03/2017
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    Confined IMCs for low temperature and high throughput D2W bonding

    Derakhshandeh, Jaber  
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    La Tulipe, Douglas Charles  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
    Proceedings paper
    2022, International Conference on Electronics Packaging (ICEP), MAY 11-14, 2022, p.131-132
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    Die to wafer 3D stacking for below 10μm pitch microbumps

    Derakhshandeh, Jaber  
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    Hou, Lin  
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    De Preter, Inge  
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    Gerets, Carine  
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    Suhard, Samuel  
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    Dubey, Vikas
    Proceedings paper
    2016, IEEE International Conference on 3D System Integration - 3DIC, 9/11/2016, p.1-4
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    ELD NiB for microbumps passivation and wirebonding

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    El-Mekki, Zaid  
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    Hou, Lin  
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    Gerets, Carine  
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    Dictus, Dries  
    Proceedings paper
    2020, 8th IEEE Electronics System-Integration Technology Conference (ESTC), SEP 15-18, 2020
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    Formation, processing and characterization of Co-Sn intermetallic compounds for potential integration in 3D interconnects

    Vakanas, George
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    O, Minho
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    Dimcic, Biljana
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    Vanstreels, Kris  
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    Vandecasteele, Bjorn  
    Journal article
    2015, Microelectronic Engineering, 140, p.72-80
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    Growth rate of IMC in the binary sytems of Co/Sn and Cu/Sn

    Nagano, Fuya  
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    Kajihara, Masanori
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    Derakhshandeh, Jaber  
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    Hou, Lin  
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    Van De Peer, Myriam  
    Proceedings paper
    2017, IEEE International Interconnect Technology Conference - IITC, 16/07/2017, p.1-3
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    Impact of ELD layers in mechanical properties of microbumps for 3D stacking

    Hou, Lin  
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    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Vandersmissen, Kevin  
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    Rebibis, Kenneth June  
    Proceedings paper
    2016, 6th Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5
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    Impact of NiB and Cu ELD layers on surface morphology and IMC growth rate of CoSn CuSn and NiSn systems

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Vandersmissen, Kevin  
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    Rebibis, Kenneth June  
    Meeting abstract
    2016, Materials for Advanced Metallization Conference - MAM, 21/03/2016
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    Improving solder wetting of micro bumps on metal pads using metallic or organic pad coatings

    De Preter, Inge  
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    Derakhshandeh, Jaber  
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    Bex, Pieter  
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    Fodor, Ferenc  
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    Cherman, Vladimir  
    Proceedings paper
    2017, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - IEEE S3S, 16/10/2017, p.8.9
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    Investigation of Co thin film as buffer layer applied to Cu/Sn eutectic bonding and UBM with Sn, SnCu, and SAC solders joints

    Tang, Ya-Sheng
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    Derakhshandeh, Jaber  
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    Kho, Yi-Tung
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    Chang, Yao-Jen
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    Slabbekoorn, John  
    Journal article
    2017, IEEE Transactions on Components, Packaging and Manufacturing Technology, (7) 11, p.1899-1905
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    Low temperature backside damascene processing on temporary carrier wafer targeting 7 mu m and 5 mu m pitch microbumps for N equal and greater than 2 die to wafer TCB stacking

    Derakhshandeh, Jaber  
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    Beyne, Eric  
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    Beyer, Gerald  
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    Capuz, Giovanni  
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    Cherman, Vladimir  
    Proceedings paper
    2022, 72nd IEEE Electronic Components and Technology Conference (ECTC), MAY 31-JUN 01, 2022, p.1108-1113
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