Browsing by Author "De Preter, Inge"
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Publication 10 and 7 mu m Pitch Thermo-compression Solder Joint, Using A Novel Solder Pillar And Metal Spacer Process
Proceedings paper2020, 70th IEEE Electronic Components and Technology Conference (ECTC), JUN 03-30, 2020, p.617-622Publication 3D integration challenges for fine pitch back side micro-bumping on ZoneBOND™ wafers
Proceedings paper2012, 4th Electronics System Integration Technologies Conference - ESTC, 17/09/2012Publication 3D stacking cobalt and nickel microbumps and kinetics of corresponding IMCs at low temperatures
Proceedings paper2017, IEEE International Interconnect Technology Conference - IITC, 16/05/2017, p.1-3Publication 3D stacking of Co and Ni based microbumps
; ; ; ; ;Wang, TengProceedings paper2016, Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5Publication 3D stacking using bump-less process for sub 10μm pitches
Proceedings paper2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133Publication A study on IMC morphology and integration flow for low temperature and high throughput TCB down to 10 mu m pitch microbumps
Proceedings paper2021, IEEE 71st Electronic Components and Technology Conference (ECTC), JUN 01-JUL 04, 2021, p.1119-1124Publication Bismuth-based solder characterization for lower-temperature assembly of thermally-sensitive components in 3D interconnect applications
Meeting abstract2014, 23rd Conference on Materials for Advanced Metallization - MAM, 2/03/2013Publication Co-Sn intermetallic compoundsfor potential integration in 3D interconnects
Meeting abstract2014, 23rd Conference on Materials for Advanced Metallization - MAM, 2/03/2014Publication Cobalt UBM for fine pitch microbump applications in 3DIC
Proceedings paper2015, IEEE International Interconnect Technology Conference - IITC / Materials for Advanced Metallization Conference - MAM, 18/05/2015, p.221-224Publication Comparing SAM (Self-Assembled Monolayer) deposition methods to passivate copper microbumps for 3D stacking
Meeting abstract2017, Materials for Advanced Metallization Conference - MAM, 26/03/2017Publication Confined IMCs for low temperature and high throughput D2W bonding
Proceedings paper2022, International Conference on Electronics Packaging (ICEP), MAY 11-14, 2022, p.131-132Publication Die to wafer 3D stacking for below 10μm pitch microbumps
Proceedings paper2016, IEEE International Conference on 3D System Integration - 3DIC, 9/11/2016, p.1-4Publication ELD NiB for microbumps passivation and wirebonding
Proceedings paper2020, 8th IEEE Electronics System-Integration Technology Conference (ESTC), SEP 15-18, 2020Publication Formation, processing and characterization of Co-Sn intermetallic compounds for potential integration in 3D interconnects
Journal article2015, Microelectronic Engineering, 140, p.72-80Publication Growth rate of IMC in the binary sytems of Co/Sn and Cu/Sn
Proceedings paper2017, IEEE International Interconnect Technology Conference - IITC, 16/07/2017, p.1-3Publication Impact of ELD layers in mechanical properties of microbumps for 3D stacking
Proceedings paper2016, 6th Electronics System-Integration Technology Conference - ESTC, 13/09/2016, p.1-5Publication Impact of NiB and Cu ELD layers on surface morphology and IMC growth rate of CoSn CuSn and NiSn systems
Meeting abstract2016, Materials for Advanced Metallization Conference - MAM, 21/03/2016Publication Improving solder wetting of micro bumps on metal pads using metallic or organic pad coatings
Proceedings paper2017, IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference - IEEE S3S, 16/10/2017, p.8.9Publication Investigation of Co thin film as buffer layer applied to Cu/Sn eutectic bonding and UBM with Sn, SnCu, and SAC solders joints
Journal article2017, IEEE Transactions on Components, Packaging and Manufacturing Technology, (7) 11, p.1899-1905Publication Low temperature backside damascene processing on temporary carrier wafer targeting 7 mu m and 5 mu m pitch microbumps for N equal and greater than 2 die to wafer TCB stacking
Proceedings paper2022, 72nd IEEE Electronic Components and Technology Conference (ECTC), MAY 31-JUN 01, 2022, p.1108-1113