Browsing by Author "Duan, Meng"
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Publication An investigation on border traps in III-V MOSFETs with an In0.53Ga0.47As channel
Journal article2015, IEEE Transactions on Electron Devices, (62) 11, p.3633-3639Publication Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging
Publication Key issues and solutions for characterizing hot carrier aging of nanometer scale nMOSFETs
Journal article2017, IEEE Transactions on Electron Devices, (64) 6, p.2478-2484Publication New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation
Journal article2013, IEEE Transactions on Electron Devices, (60) 8, p.2505-2511Publication Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation
Journal article2017, IEEE Transactions on Electron Devices, (64) 4, p.1467-1473