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Browsing by Author "El Kazzi, Salim"

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    2D materials integration: The long journey from a lab-to-fab

    El Kazzi, Salim
    Proceedings paper
    2018, SEMICON Europa 2018: Strategic Materials Conference, 13/11/2108
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    2D materials: roadmap to CMOS integration

    Huyghebaert, Cedric  
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    Schram, Tom  
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    Smets, Quentin  
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    Agarwal Kumar, Tarun
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    Verreck, Devin  
    Proceedings paper
    2018, IEEE Electron Devices Meeting - IEDM, 1/12/2018, p.512-515
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    Band-to-band tunneling MOSCAPs for rapid TFET characterization

    Smets, Quentin  
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    Verhulst, Anne  
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    Lin, Dennis  
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    Verreck, Devin  
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    Merckling, Clement  
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    El Kazzi, Salim
    Proceedings paper
    2014, 72nd Annual Device Research Conference - DRC, 22/06/2014, p.63-64
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    Built-in sheet charge as an alternative to dopant pockets in tunnel field-effect transistors

    Verreck, Devin  
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    Verhulst, Anne  
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    Xiang, Yang  
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    Yakimets, Dmitry  
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    El Kazzi, Salim
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    Parvais, Bertrand  
    Journal article
    2018, IEEE Journal of the Electron Devices Society, 6, p.658-663
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    Calibration of the effective tunneling bandgap in GaAsSb/InGaAs for improved TFET performance prediction

    Smets, Quentin  
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    Verhulst, Anne  
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    El Kazzi, Salim
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    Gundlach, David
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    Richter, Curt
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    Mocuta, Anda
    Journal article
    2016, IEEE Transactions on Electron Devices, (63) 11, p.4248-4254
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    Careful stoichiometry monitoring and doping control during the tunneling interface growth of an n + InAs(Si)/p + GaSb(Si) Esaki diode

    El Kazzi, Salim
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    Alian, AliReza  
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    Hsu, Brent  
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    Verhulst, Anne  
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    Walke, Amey  
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    Favia, Paola  
    Journal article
    2018, Journal of Crystal Growth, 484, p.86-91
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    Covalent functionalization of molybdenum disulfide by chemically activated diazonium salts

    Daukiya, Lakshya
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    Teyssandier, Joan
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    Eyley, Samuel
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    El Kazzi, Salim
    Journal article
    2021, NANOSCALE, (13) 5, p.2972-2981
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    Deep levels in Metal-Oxide-Semiconductor Capacitors Fabricated on n-type In0.53Ga0.47As Lattice Matched to InP Substrates

    Simoen, Eddy  
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    Hsu, Brent  
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    Alian, AliReza  
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    El Kazzi, Salim
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    Wang, Chong  
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    Ori, Hiroyuki
    Journal article
    2019, Semiconductor Science and Technology, (34) 7, p.75024
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    Demonstration of direction dependent conduction through MoS2 films prepared by tunable mass transport fabrication

    Chiappe, Daniele
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    Mongillo, Massimo  
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    Asselberghs, Inge  
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    El Kazzi, Salim
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    Caymax, Matty  
    Journal article
    2016, ECS Journal of Solid State Science and Technology, (5) 11, p.Q3046-Q3049
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    Diffraction studies for stoichiometry effects in BaTiO3 grown by molecular beam epitaxy on Ge(001)

    Hsu, Mark
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    Merckling, Clement  
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    El Kazzi, Salim
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    Pantouvaki, Marianna  
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    Richard, Olivier  
    Journal article
    2016, Journal of Applied Physics, (120) 22, p.225114
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    Dislocations behavior in highly mismatched III-Sb growth and their impact on the fabrication of top-down n+InAs/p+GaSb NW tunneling devices

    El Kazzi, Salim
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    Alian, AliReza  
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    Hsu, Brent  
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    Favia, Paola  
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    Merckling, Clement  
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    Lu, Wenjie
    Journal article
    2018-11, Journal of Applied Physics, (124) 19, p.195703
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    Epitaxial registry and crystallinity of MoS2 via molecular beam and metalorganic vapor phase van der Waals epitaxy

    Mortelmans, Wouter  
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    El Kazzi, Salim
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    Groven, Benjamin  
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    Nalin Mehta, Ankit  
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    Balaji, Yashwanth  
    Journal article
    2020, Applied Physics Letters, (117) 3, p.33101
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    Extracting the effective bandgap of heterojunctions using Esaki diode I-V meaurements

    Smets, Quentin  
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    Verhulst, Anne  
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    El Kazzi, Salim
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    Verreck, Devin  
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    Richard, Olivier  
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    Bender, Hugo  
    Journal article
    2015, Applied Physics Letters, (107) 7, p.72101
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    Forcing epitaxial relationships between GS-MBE MX2 grown layers and commercial substrates

    El Kazzi, Salim
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    Mortelmans, Wouter  
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    Nuytten, Thomas  
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    Radu, Iuliana  
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    Merckling, Clement  
    Meeting abstract
    2017, E-MRS, 18/09/2017
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    Fundamental limitation of van der Waals homoepitaxy by stacking fault formation in WSe2

    Mortelmans, Wouter  
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    Nalin Mehta, Ankit  
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    Balaji, Yashwanth  
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    El Kazzi, Salim
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    Sergeant, Stefanie  
    Journal article
    2020, 2D Materials, (7) 2, p.25027
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    High mobility In0.53Ga0.47As MOSFETs with steep sub-threshold slope achieved by remote reduction of native III-V oxides with metal electrodes

    Yoshida, Shinichi
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    Lin, Dennis  
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    Vais, Abhitosh  
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    Alian, AliReza  
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    Franco, Jacopo  
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    El Kazzi, Salim
    Journal article
    2017, IEEE Journal of the Electron Devices Society, (5) 6, p.480-484
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    Impact of field-induced quantum confinement on the onset of tunneling field-effect transistors: Experimental verification

    Smets, Quentin  
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    Verhulst, Anne  
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    Martens, Koen  
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    Lin, Dennis  
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    El Kazzi, Salim
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    Verreck, Devin  
    Journal article
    2014, Applied Physics Letters, (150) 20, p.203507
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    Importance of the substrate' s surface evolution during the MOVPE growth of 2D-transition metal dichalcogenides

    Mo, Jiongjiong
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    El Kazzi, Salim
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    Mortelmans, Wouter  
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    Nalin Mehta, Ankit  
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    Sergeant, Stefanie  
    Journal article
    2020, Nanotechnology, (31) 12, p.125604
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    In-depth characterization of WSe2 monolayers grown by GSMBE

    Mortelmans, Wouter  
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    El Kazzi, Salim
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    Nuytten, Thomas  
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    Crahaij, Steven
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    Meersschaut, Johan  
    Oral presentation
    2017, E-MRS Fall 2017
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    InAs/GaSb interface investigation by high resolution HAADF-STEM

    Favia, Paola  
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    Richard, Olivier  
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    El Kazzi, Salim
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    Van Marcke, Patricia  
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    Bender, Hugo  
    Meeting abstract
    2016, 16th European Microscopy Congress, 28/08/2016
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