Browsing by Author "Fieback, Moritz"
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Publication Defect and Fault Modeling Framework for STT-MRAM Testing
Journal article2021, IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, (9) 2, p.707-723Publication Design-for-Test for Intermittent Faults in STT-MRAMs
Proceedings paper2024, IEEE European Test Symposium (ETS), MAY 20-24, 2024Publication Device Aware Diagnosis for Unique Defects in STT-MRAMs
Proceedings paper2023, 32nd IEEE Asian Test Symposium (ATS), OCT 14-17, 2023, p.71-76Publication Device-Aware Test for Back-Hopping Defects in STT-MRAMs
Proceedings paper2023, Design, Automation and Test in Europe Conference and Exhibition (DATE), APR 17-19, 2023Publication Device-aware test: A new test approach towards DPPB
Proceedings paper2019-11, IEEE International Test Conference (ITC) 2019, 12/11/2019, p.1-10